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Aberration-corrected Imaging in Transmission Electron Microscopy: An Introduction [Hardcover]

Rolf Erni
1.0 out of 5 stars  See all reviews (1 customer review)

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Book Description

August 30, 2010 1848165366 978-1848165366
This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering dedicated topics in charged-particle optics and aberration correction.

The book is structured in three parts which can be read separately. While in the first part the fundamentals of the imaging techniques and their limits in conventional electron microscopes are explained, the second part provides readers with the basic principles of electron optics and the characteristics of electron lenses. The third part, focusing on aberrations, describes the functionality of aberration correctors and provides readers with practical guidelines for the daily work with aberration-corrected electron microscopes. The book represents a detailed and easy readable guide to aberration-corrected electron microscopy.

Frequently Bought Together

Aberration-corrected Imaging in Transmission Electron Microscopy: An Introduction + Scanning Transmission Electron Microscopy: Imaging and Analysis + Electron Energy-Loss Spectroscopy in the Electron Microscope (Topics in Geobiology)
Price for all three: $530.13

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Editorial Reviews


Aberration-Corrected Imaging in Transmission Electron Microscopy is impeccably edited. The schematic diagrams are accurate and informative. The equations presented are necessary and sufficient ... Practical aberration-corrected instruments have been a long time coming but are still very expensive. Researchers who are fortunate enough to acquire one should also acquire a copy of Aberration-Corrected Imaging in Transmission Electron Microscopy. --Physics Today

About the Author

Rolf Erni is currently the head of Electron Microscopy Center, Swiss Federal Laboratories for Materials Testing and Research (Empa), Dübendorf, Switzerland (starting 2009. He was the staff scientist at the National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, USA (2007-2009). Rolf Erni received his doctoral degree from the Swiss Federal Institute of Technology Zurich (ETH Zurich) at the Institute of Applied Physics. He carried out postdoctoral studies at the University of California at Davis and at the National Center for Electron Microscopy (NCEM), Lawrence Berkeley National Laboratory.

Product Details

  • Hardcover: 348 pages
  • Publisher: Imperial College Press (August 30, 2010)
  • Language: English
  • ISBN-10: 1848165366
  • ISBN-13: 978-1848165366
  • Product Dimensions: 0.8 x 6.5 x 9.6 inches
  • Shipping Weight: 1.5 pounds (View shipping rates and policies)
  • Average Customer Review: 1.0 out of 5 stars  See all reviews (1 customer review)
  • Amazon Best Sellers Rank: #1,597,863 in Books (See Top 100 in Books)

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1 of 5 people found the following review helpful
1.0 out of 5 stars NOT physics, too abstract December 22, 2011
Format:Hardcover|Verified Purchase
first of all, it is not a physics

then, it says "introduction", but gives too little information about aberration. It doen't clearly gives the concept of "what is aberration? example", how is corrected in details

Thirdly, as the title is "aberration corrected", but in the content it takes more than half of the book to the "uncorrected".

Compared to the Willams & Cart's book, this one contains too little (only 1/100th information), but much too high a price.

Totally not worth the price
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