Aberration-Corrected Imaging in Transmission Electron Microscopy is impeccably edited. The schematic diagrams are accurate and informative. The equations presented are necessary and sufficient ... Practical aberration-corrected instruments have been a long time coming but are still very expensive. Researchers who are fortunate enough to acquire one should also acquire a copy of Aberration-Corrected Imaging in Transmission Electron Microscopy. --Physics Today
About the Author
Rolf Erni is currently the head of Electron Microscopy Center, Swiss Federal Laboratories for Materials Testing and Research (Empa), DÃ¼bendorf, Switzerland (starting 2009. He was the staff scientist at the National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, USA (2007-2009). Rolf Erni received his doctoral degree from the Swiss Federal Institute of Technology Zurich (ETH Zurich) at the Institute of Applied Physics. He carried out postdoctoral studies at the University of California at Davis and at the National Center for Electron Microscopy (NCEM), Lawrence Berkeley National Laboratory.