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This handbook describes a set of Best Practices for utilizing accelerated stress testing (AST) as part of the methodology for systematically improving the hardware reliability of manufactured products.
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Key Phrases - Statistically Improbable Phrases (SIPs):
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thermal change rates, damage superposition approach, generic subprocess, product strength distribution, maximum stress distribution, accelerated stress testing, cumulative stress failure, repetitive shock machines, component strategists, vibration stressing, threshold stress failure, destruct limits, repetitive shock vibration, environmental stress testing, power line variation, specific product samples, quality audit results, destruct levels, robust temperature, stress portfolio, stress screening, specified design limits, stress testing program, using random vibration, vibration screening
Key Phrases - Capitalized Phrases (CAPs):
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Institute of Environmental Sciences, Task Description, Manufacturing Qualification, New York, Annual Technical Meeting, Plan Program, Manufacturing Technology, Otis Elevator Company, San Diego, John Wiley, Kam Wong, Achieving Phenomenal Reliability Growth, Mount Prospect, Phase Ila, High Density Surface Mount Circuit Card, Highly Accelerated Life Test, Los Angeles, Materials Park, Nominal Nominal, Robert Camp, The Board Electronic, Disc Memory Division, Effects of Random Vibration, Hewlett-Packard Company, Larry Dawson
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