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Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics)
 
 
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Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics) [Hardcover]

Wayne B. Nelson (Author)
4.6 out of 5 stars  See all reviews (5 customer reviews)


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Book Description

0471522775 978-0471522775 February 1990 1
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists.

". . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering."
–Dev G. Raheja, Quality and Reliability Engineering International

". . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently."
–Journal of the Royal Statistical Society

A benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source.



Editorial Reviews

Review

"…an essential resource for an statistician involved in product development and testing...available in an attractive and reasonably priced format." (Technometrics, August 2005)

"Researchers in insulation and engineers in general...will find this an outstanding reference book that will be used constantly." (IEEE Electrical Insulation Magazine, May/June 2005) --This text refers to the Paperback edition.

From the Publisher

In recent years, much useful methodology has been developed in accelerated testing--this book makes it available to practitioners. Many products last so long that life testing at design conditions is impractical. However, these products can be life-tested at high-stress conditions to yield failures quickly. Such testing saves much time and money--and analyses of data from an accelerated test yield needed information on product life at design (low stress) conditions. Presents practical, modern, statistical methods for accelerated testing including test models, analyses of data and plans for testing. Each topic is self-contained for easy reference. Coverage is broad and detailed enough to serve as a text or reference. Contains many real test examples along with data analyses, computer programs and references to the literature.

Product Details

  • Hardcover: 616 pages
  • Publisher: Wiley-Interscience; 1 edition (February 1990)
  • Language: English
  • ISBN-10: 0471522775
  • ISBN-13: 978-0471522775
  • Product Dimensions: 9 x 6.6 x 1.1 inches
  • Shipping Weight: 2 pounds
  • Average Customer Review: 4.6 out of 5 stars  See all reviews (5 customer reviews)
  • Amazon Best Sellers Rank: #620,353 in Books (See Top 100 in Books)

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27 of 27 people found the following review helpful:
5.0 out of 5 stars best book in accelerated testing, February 9, 2008
This review is from: Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics) (Hardcover)
Nelson is a private consultant who has worked on countless practical problems in reliability from his consulting practice and previous employment at General Electric. He is an excellent lecturer and writer. His earlier book "Applied Life Data Analysis" was considered to be one of the best texts on reliability.
This book is very thorough in its treatment of all aspects of accelerated testing and is filled with many good references. Nelson carefully defines the mathematical models which consist of two components, (1) an acceleration function which describes how the mean lifetime changes as a function of the acceleration factor and (2) a probability distribution that explains the random variability of outcomes at each acceleration factor. A particular mean function could be the Arrhenius relationship and the probability distribution could be exponential. Hence there is not a single Arrhenius acceleration model but rather an Arrhenius-exponential, an Arrhenius-lognormal or an Arrhenius-Weibull model. The book is filled with interesting theory and examples. Nelson provides excellent practical guidance based on his wealth of experience.

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1 of 1 people found the following review helpful:
5.0 out of 5 stars Accelerated Life Testing Bible !, February 11, 2010
By 
Amar Thiraviam (Daytona Beach , FL , USA) - See all my reviews
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This is undoubtedly the best book in quantitative accelerated life testing. Dr.Nelson does an excellent job in clearly explaining the statistical models and the life data analysis concepts related to accelerated testing. I cant think of any other book that comes even close to this work. A great reference for anyone interested in Accelerated Testing.
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1 of 1 people found the following review helpful:
4.0 out of 5 stars Should be on every Developer and Engineer's shelf., October 31, 2006
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Dr. Taylor does his usual great job covering a difficult subject - ties in well with his "Applied Life Data Analysis", the revered reliability resource. Because of his GE background, he emphasizes experimental plans and analysis methods (i.e.: partially censored) which permit you to make good predictions regarding a product or system while you are still collecting data (e.g.: management wants an answer NOW, even if the experiment is not completed). A few more examples of how "typical" systems behave would be helpful, but otherwise a great resource.
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Inside This Book (learn more)
First Sentence:
This chapter presents mathematical models for accelerated life tests with constant stress. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
mean log life, good compromise plans, reallocated plan, normal life distribution, same life distribution, assumed life distribution, basic cumulative exposure model, failure censored data, including nonfailures, ramp stress, optimum test plans, test stress levels, inverse power relationship, extreme value paper, product life distribution, multivariable relationships, remaining failure modes, singly censored data, normal confidence limits, parallel disk electrodes, multiply censored data, competing failure modes, smallest extreme value distribution, accelerating variable, extreme value plot
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Inch Electrodes, Induction Hardened, Monte Carlo, Redo Problem, Mean Std, Failure Plotting Positions, Repeat Problem, Use Bartlett
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