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Advanced Computing in Electron Microscopy [Hardcover]

Earl J. Kirkland
4.8 out of 5 stars  See all reviews (4 customer reviews)

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Book Description

September 2, 2010 1441965327 978-1441965325 2nd ed. 2010

This book provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help interpret and understand high resolution information in recorded electron micrographs. This revised edition contains new sections on recent instrumental developments and updated references. It should be useful for beginning and experienced users at the advanced undergraduate or graduate level.

This new edition will be a revision of the existing text, including new developments in this field since the original manuscript and updated references.  Additional material will include abberration corrected instruments and confocal electron microscopy. The references and examples will be improved and expanded and some sections polished to improve ease of understanding.

Frequently Bought Together

Advanced Computing in Electron Microscopy + Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) + Aberration-corrected Analytical Electron Microscopy
Price for all three: $269.22

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Editorial Reviews


From the reviews of the second edition:

“It is thirteen years since the first edition of Advanced Computing in Electron Microscopy by E.J. Kirkland appeared. … the book contains much guidance in this complex area and the list of references draws attention to many relevant papers that can all too easily be overlooked.” (Ultramicroscopy, Vol. 116, 2012)

From the Back Cover

Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field.

This enhanced second edition includes:

-descriptions of new developments in the field

-updated references

-additional material on aberration corrected instruments and confocal electron microscopy

-expanded and improved examples and sections to provide stronger clarity

Product Details

  • Hardcover: 300 pages
  • Publisher: Springer; 2nd ed. 2010 edition (September 2, 2010)
  • Language: English
  • ISBN-10: 1441965327
  • ISBN-13: 978-1441965325
  • Product Dimensions: 9.2 x 6.1 x 0.7 inches
  • Shipping Weight: 1.8 pounds (View shipping rates and policies)
  • Average Customer Review: 4.8 out of 5 stars  See all reviews (4 customer reviews)
  • Amazon Best Sellers Rank: #2,022,903 in Books (See Top 100 in Books)

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Customer Reviews

4.8 out of 5 stars
4.8 out of 5 stars
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Most Helpful Customer Reviews
3 of 3 people found the following review helpful
By Ulfilas
For the typical materials scientist, the first book for learning transmission electron microscopy would need to be something much more elementary than this book, such as Carter and Williams' Transmission Electron Microscopy: A Textbook for Materials Science (4 Vol set), or other introductory texts on transmission electron microscopy. The classic by Hirsh et al. Electron Microscopy of Thin Crystals also provides a good introduction for the more ambitious novice. The best introductory text for the student interested in the detailed physics of electron diffraction is Mark De Graef's Introduction to Conventional Transmission Electron Microscopy (Cambridge Solid State Science).

Kirkland's book is intended for the student with a detailed knowledge of Fourier tranforms, at the level of Bracewell's The Fourier Transform & Its Applications. Readers of Kirkland's book would also do well to have first mastered Cowley's book Diffraction Physics, Third Edition (North-Holland Personal Library), which provides the detailed physical motivation for multislice theory. This book is reasonably easy to read for those who have already read Cowley--but still very helpful to due to its admirable brevity and focus. Authors often fall into the trap of attempting to address too many topics--only to frustrate the reader.
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4.0 out of 5 stars Highly recommended November 24, 2013
Format:Hardcover|Verified Purchase
I have bought this book to learn the image formation mechanisms in TEM, especially the bright-field HRTEM.
While most of the introductory TEM books explain TEM resolution limit in terms of CTF or dumping envelopes,
Kirkland's book tells you the real-world situation is not that simple.
This is probably the single available text book about TEM image simulation that is mostly scattered among journal papers
or conferece proceedings which are basically hard to find and crystallize...
So actually this book was really helpful to me for constructing my simulation model.

The text and illustrations are clear and concise. The author does not suppose "high-level" math nor computer science.
In my opinion, the reader should be familiar with introductory-level TEM operations (or at least some TEM text).

I rated 4 stars because the simulation software the author provided in his web site is not easy to use,
and unfortunately I could not run it on my PC... Especially, the codes use an external FFT packages made by other party
and this is also hard to install...

Overall, the text is very nice and highly recommended, and I'm sure that readers understand what are behind the TEM image
simulations. If you want to actually run, you'll need another hard work (or simply buy some commercial softwares..).
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5.0 out of 5 stars A must read electron microscopy book September 5, 2010
By Student
Format:Hardcover|Verified Purchase
I have both the first edition and the second one just came out. It is definitely the best book on this topic.
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1 of 2 people found the following review helpful
5.0 out of 5 stars Knowlege of Hirsh is not required July 15, 2006
I don't think a knowledge of Hirsh is required. This book is all about how to simulate atomic resolution S/TEM images. All the old-school two-beam stuff in Hirsh is not required. In addition, the first edition of this book was exclusively real space approach. It was only because Spence complained about the fact it did not have enough bloch-wave approach explained in the 1st edition that the author unwillingly put some bloch-wave stuff in despite the fact the bloch-wave approach is not accurate enough for ADF-STEM image simulations (as shown by Lebeau and Allen).
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