Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes. This book is of interest to people in universities, research centres and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and also to those developing such mathematical tools.
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Front Cover | Front Flap | Table of Contents | First Pages | Index | Back Flap | Back Cover | Surprise Me!
Inside This Book
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First Sentence:
In many metrology applications, it is desirable to replace a prescribed set of data by an approximating curve or surface. Read the first page Key Phrases - Capitalized Phrases (CAPs): (learn more)
World Scientific Publishing Company, Monte Carlo, National Physical Laboratory, Advanced Mathematical Tools, New York, Microsoft Excel, Franco Pavese, Mutual Recognition Arrangement, Italy E-mail, Journal of Numerical Analysis, Alan Steele, Bureau International des Poids, Consultative Committee, John Wiley, University of Huddersfield, Academic Press, Istituto Elettrotecnico Nazionale, Physikalisch-Technische Bundesanstalt, Van Loan, Visual Basic, Bernd Siebert, Einsatz von Datenbanken, Quantified Demonstrated Equivalence, Quantifying Demonstrated Equivalence, Central Limit Theorem New!
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Front Cover | Front Flap | Table of Contents | First Pages | Index | Back Flap | Back Cover | Surprise Me!
In many metrology applications, it is desirable to replace a prescribed set of data by an approximating curve or surface. Read the first page Key Phrases - Capitalized Phrases (CAPs): (learn more)
World Scientific Publishing Company, Monte Carlo, National Physical Laboratory, Advanced Mathematical Tools, New York, Microsoft Excel, Franco Pavese, Mutual Recognition Arrangement, Italy E-mail, Journal of Numerical Analysis, Alan Steele, Bureau International des Poids, Consultative Committee, John Wiley, University of Huddersfield, Academic Press, Istituto Elettrotecnico Nazionale, Physikalisch-Technische Bundesanstalt, Van Loan, Visual Basic, Bernd Siebert, Einsatz von Datenbanken, Quantified Demonstrated Equivalence, Quantifying Demonstrated Equivalence, Central Limit Theorem New!
Concordance | Text Stats Browse Sample Pages:
Front Cover | Front Flap | Table of Contents | First Pages | Index | Back Flap | Back Cover | Surprise Me!
Citations (learn more)
This book cites 58
books:
See all 58 books this book cites
- Advanced Mathematical And Computational Tools in Metrology (Series on Advances in Mathematics for Applied Sciences) by P. Ciarlini on 27 pages
- An Introduction to the Bootstrap (Chapman & Hall/CRC Monographs on Statistics & Applied Probability) by Bradley Efron on page 76, page 105, and page 117
- Matrix Computations (Johns Hopkins Studies in Mathematical Sciences)(3rd Edition) by Gene H. Golub on page 168, page 176, and page 250
- Practical Optimization by Philip E. Gill on page 30, page 184, and page 314
- Numerical Recipes: The Art of Scientific Computing by William H. Press on page 84, and page 223
See all 58 books this book cites
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