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Advanced Mathematical And Computational Tools in Metrology (Series on Advances in Mathematics for Applied Sciences)
 
 
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Advanced Mathematical And Computational Tools in Metrology (Series on Advances in Mathematics for Applied Sciences) [Hardcover]

P. Ciarlini (Editor), E Filipe (Editor), A B Forbes (Editor), F Pavese (Editor), C Perruchet (Editor), B R L Siebert (Editor)


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Book Description

9812566740 978-9812566744 March 6, 2006
This volume collects the refereed contributions based on the presentations made at the Seventh Workshop on Advanced Mathematical and Computational Tools in Metrology, a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources. The volume contains articles by world renowned metrologists and mathematicians involved in measurement science and, together with the six previous volumes in this series, constitutes an authoritative source of the mathematical, statistical and software tools necessary in modern metrology.

Product Details

  • Hardcover: 384 pages
  • Publisher: World Scientific Pub Co Inc (March 6, 2006)
  • Language: English
  • ISBN-10: 9812566740
  • ISBN-13: 978-9812566744
  • Product Dimensions: 1 x 6.2 x 9 inches
  • Shipping Weight: 1.6 pounds
  • Amazon Best Sellers Rank: #7,215,199 in Books (See Top 100 in Books)

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Inside This Book (learn more)
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
vacuum metrology, key comparison reference value, metrological surveillance, sound calibrator, variational distance function, insert voltage method, pertinent puzzle, thermopower values, interlaboratory analysis, artefact properties, strada delle cacce, humidity coefficients, geometrical deviations, concordance correlation coefficient, uncertainty matrix, soft sensors, legal metrology, geometric format, standard uncertainty, coverage interval, resolving condition, emf values, most efficient estimator, uncertainty budget, causal graph
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Monte Carlo, World Scientific, National Physical Laboratory, New York, Mean Mean Mean Mean, Repeated Structure, Fast Fourier Transform, John Wiley, Physikalisch-Technische Bundesanstalt, European Commission, Hampton Road, Cambridge University Press, Kjaer Type, Measurement Instrument Directive, Academic Press, Cachan-Université Paris, Clarendon Press, Einsatz von Datenbanken, Lecture Notes, Matrix Computations, Metrologia Vol, Microsoft Excel, Prentice Hall, Van Loan
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