Amazon.com: Advances in Biometrics: International Conference, ICB 2007, Seoul, Korea, August 27-29, 2007, Proceedings (Lecture Notes in Computer Science) (Lecture ... Vision, Pattern Recognition, and Graphics) (9783540745488): Seong-Whan Lee, Stan Z. Li: Books

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Advances in Biometrics: International Conference, ICB 2007, Seoul, Korea, August 27-29, 2007, Proceedings (Lecture Notes in Computer Science) (Lecture ... Vision, Pattern Recognition, and Graphics)
 
 
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Advances in Biometrics: International Conference, ICB 2007, Seoul, Korea, August 27-29, 2007, Proceedings (Lecture Notes in Computer Science) (Lecture ... Vision, Pattern Recognition, and Graphics) [Paperback]

Seong-Whan Lee (Editor), Stan Z. Li (Editor)

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Book Description

September 14, 2007 3540745483 978-3540745488 1

This book constitutes the refereed proceedings of the International Conference on Biometrics, ICB 2007, held in Seoul, Korea, August 27-29, 2007.

The 34 revised full papers presented were carefully reviewed and selected from 303 submissions. Biometric criteria covered by the papers are assigned to face, fingerprint, iris, speech and signature, biometric fusion and performance evaluation, gait, keystrokes, and others. In addition the results of the Face Authentication Competition (FAC 2006) are also announced in this volume.


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Inside This Book (learn more)
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
iris codes, keystroke dynamics, local binary patterns, palmprint database, face authentication, bayesian networks, hausdorff distance, fingerprint verification competition, repudiation detection, goodness measure, whole face image, occluded image, independent component analysis, fuzzy vault based, elastic bunch graph matching, image watermarking techniques, altitude features, topological structure, night gait dataset, characterizing key local variations, active shape models, computational learning theory, biometric sample quality, kernel subspace classifier, fuzzy vault framework
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Pattern Recognition, Springer-Verlag Berlin Heidelberg, Los Alamitos, International Conference, Computer Society Press, New York, Chinese Academy of Sciences, Image Processing, Computer Vision, Signal Processing, False Accept Rate, Computer Society Conference, Biometrics Engineering Research Center, Hong Kong, Institute of Automation, John Wiley, Poincare Index, Technical Report, Yonsei University, Discriminant Analysis, Gaussian Mixture Models, Pattern Anal, Fake Finger Detection Based, Int'l Conf, International Workshop
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