This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
Advances in Electronic Testing: Challenges and Methodologies
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Editorial Reviews
Review
"There is a definite need for documenting the advances in testing … I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. […] the book provides, besides novel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. […] This latest addition to the Frontiers Series is destined to serve an important role."
From the Foreword by Vishwani D. Agrawal, Consulting Editor
Frontiers in Electronic Testing Book Series
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Inside This Book
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Key Phrases - Statistically Improbable Phrases (SIPs):
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nanometer technologies, silicon debug, automatic test pattern generation, test workshop, automatic test equipment, wafer sort, structural tester, electrical validation, transition delay fault model, path delay test, debug engineer, scan enable signal, analog buses, wrapper cells, copper voids, resistive vias, failing circuit, memory test patterns, tester platform, local clock skew, overall test cost, standard test interface, defect universe, tester architecture, tester memory Key Phrases - Capitalized Phrases (CAPs): (learn more)
Electronic Testing, International Test Conference, Defect-Oriented Testing, Kluwer Academic Publishers, High-Speed Digital Test Interfaces, Loaded Board Testing, Test Symposium, Test of Computers, Low-Cost Testers, Prentice Hall, Built-In Self-Test, Howard Johnson, International Test C'on, New York, Bob Madge, Standards Board, Texas Instruments, Low Cost Structural Tester, Memory Technology, Case Study, Byzantine Generals, Printed Circuit Design, Electronic Design Automation, Loop-back Loop-back, Web Site New!
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
nanometer technologies, silicon debug, automatic test pattern generation, test workshop, automatic test equipment, wafer sort, structural tester, electrical validation, transition delay fault model, path delay test, debug engineer, scan enable signal, analog buses, wrapper cells, copper voids, resistive vias, failing circuit, memory test patterns, tester platform, local clock skew, overall test cost, standard test interface, defect universe, tester architecture, tester memory Key Phrases - Capitalized Phrases (CAPs): (learn more)
Electronic Testing, International Test Conference, Defect-Oriented Testing, Kluwer Academic Publishers, High-Speed Digital Test Interfaces, Loaded Board Testing, Test Symposium, Test of Computers, Low-Cost Testers, Prentice Hall, Built-In Self-Test, Howard Johnson, International Test C'on, New York, Bob Madge, Standards Board, Texas Instruments, Low Cost Structural Tester, Memory Technology, Case Study, Byzantine Generals, Printed Circuit Design, Electronic Design Automation, Loop-back Loop-back, Web Site New!
Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 11
books:
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- Embedded Processor-Based Self-Test by Dimitris Gizopoulos in Front Matter, and page 260
- The Boundary-Scan Handbook by Kenneth P. Parker on page 259, and page 406
- Testing Semiconductor Memories: Theory and Practice by A. J. Van De Goor on page 260, and page 299
- Microwave Circuit Modeling Using Electromagnetic Field Simulation (Artech House Microwave Library) by Daniel G. Swanson Jr. on page 178
- Boundary-Scan Interconnect Diagnosis (Frontiers in Electronic Testing) by José T. de Sousa in Front Matter
See all 11 books this book cites
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