Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Praise for the Series
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
--MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. CHAPMAN in LABORATORY PRACTICE
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
--MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. CHAPMAN in LABORATORY PRACTICE
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Inside This Book
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Key Phrases - Statistically Improbable Phrases (SIPs):
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discrete straightness, shortest path base graph, ferrite puck, compact chord property, confocal theta microscope, index additivity property, theta microscopy, microstrip circulators, circulator structure, spectral precision distance microscopy, digital arc, circulator device, buried channel devices, discrete convexity, digital straight segment, jet vapor deposition, chord properties, ferromagnetic resonance frequency, illumination axis, circulation behavior, reset transistor, fractional transform, digitization scheme, digital topology, ferrite medium Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Plenum Press, Academic Press, Van Der Voort, Van Lint, Applied Optics, New Jersey, Optics Communications, Optics Letters, Electron Devices, Texas Instruments, The Netherlands, Optical Society of America, Biological Con, The Electrochemical Society Press, Computer Vision, Englewood Cliffs, Fine Error Sensor, Microwave Theory Tech, Nuclear Science, Pergamon Press, San Diego, School of Mathematics Preprint, The University of New South Wales, Van Duzer New!
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
discrete straightness, shortest path base graph, ferrite puck, compact chord property, confocal theta microscope, index additivity property, theta microscopy, microstrip circulators, circulator structure, spectral precision distance microscopy, digital arc, circulator device, buried channel devices, discrete convexity, digital straight segment, jet vapor deposition, chord properties, ferromagnetic resonance frequency, illumination axis, circulation behavior, reset transistor, fractional transform, digitization scheme, digital topology, ferrite medium Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Plenum Press, Academic Press, Van Der Voort, Van Lint, Applied Optics, New Jersey, Optics Communications, Optics Letters, Electron Devices, Texas Instruments, The Netherlands, Optical Society of America, Biological Con, The Electrochemical Society Press, Computer Vision, Englewood Cliffs, Fine Error Sensor, Microwave Theory Tech, Nuclear Science, Pergamon Press, San Diego, School of Mathematics Preprint, The University of New South Wales, Van Duzer New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 12
books:
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59
books
cite this book:
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- Confocal Microscopy by T. Wilson on page 341
- Semiconductor Devices: Solutions Manual: Physics and Technology by Simon M. Sze on page 92
- Discrete Mathematics by Wiley on page 236
- Hubble Space Telescope (Above and Beyond) by Jon Eric Hakkila on page 93
- The Stopping and Range of Ions in Solids (Stopping and Range of Ions in Matter, Vol 1) by J. F. Ziegler on page 93
See all 12 books this book cites
- Advances in Imaging and Electron Physics, Volume 142 (Advances in Imaging & Electron Physics) by Peter W. Hawkes on 4 pages
- Advances in Imaging and Electron Physics, Volume 115 (Srlances in Imaging & Electron Physics) by Peter W. Hawkes on 4 pages
- Advances in Imaging and Electron Physics, Volume 141 (Advances in Imaging & Electron Physics) by Peter W. Hawkes in Front Matter, page 84, and page 251
- Advances in Imaging and Electron Physics, Volume 120 (Srlances in Imaging & Electron Physics) by Peter W. Hawkes in Copyright, Front Matter, and page 284
- Aspects of Image Processing and Compression, Volume 119 (Advances in Imaging and Electron Physics) by Peter W. Hawkes in Copyright, and page 125
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