This is a state-of-the-art treatment of the circuit design of digital integrated circuits. It includes coverage of the basic concepts of static characteristics (voltage transfer characteristics, noise margins, fanout, power dissipation) and dynamic characteristics (propagation delay times), and the interrelationships among these parameters. The authors are regarded as leading authorities in integrated circuits and MOS technology.
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Most Helpful Customer Reviews
8 of 9 people found the following review helpful:
5.0 out of 5 stars
Great book,
By sean (Toronto, ON) - See all my reviews
This review is from: Analysis and Design of Digital Integrated Circuits (Hardcover)
This is a very readable and complete book on Design and Analysis of Digital Integrated Circuits. It has many great examples and in depth explanations. The book compares the differences between different technologies and the general trends for deep submicron circuits. It is also very complete as it covers subjects from fabrication and layout, memory design, high speed CMOS logic design as well as power grid and clock design. This book is a must in the library of anyone interested in digital circuit design.
5 of 6 people found the following review helpful:
5.0 out of 5 stars
Excellent and insightful,
By Pedram Lajevardi (Vancouver, BC, Canada) - See all my reviews
This review is from: Analysis and Design of Digital Integrated Circuits (Hardcover)
I found this book very helpful. After reading the book (and comprehending the material), I gained a profound insight into analysis and design of digital circuits.
3 of 4 people found the following review helpful:
5.0 out of 5 stars
Excellent book,
By Steffen Rochel (San Francisco, CA) - See all my reviews
This review is from: Analysis and Design of Digital Integrated Circuits (Hardcover)
The book serves as textbook for students as well as reference for digital circuit designer and EDA developers. Starting from the fundamentals of semiconductor physics and fabrication the reader will step through the key issues of digital IC design in deep submicron technology. The examples support the understanding of the material very well.
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Inside This Book
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First Sentence:
Integrated circuits (ICs) are part of virtually every electronic component in the world today, such as cell phones, personal digital assistants, pagers, personal computers, printers, set-top boxes, automobiles, and so on. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
optimal stage effort, semiconductor memory design, saturated enhancement load, bitline capacitance, fanout capacitance, branching effort, load line construction, replica circuit, domino stage, threshold voltage equation, grounded capacitance, domino logic, electrical effort, third inverter, digital integrated circuits, logical effort, lateral capacitance, voltage transfer characteristics, identical inverters, interconnect issues, interconnect design, access transistors, wire capacitance, precharge phase, buffer insertion Key Phrases - Capitalized Phrases (CAPs): (learn more)
Kluwer Academic Publishers, Vin Vout, Vout Vout, Vout Vin, New York, Summary References Problems, Parameters Units, Second Edition, Upper Saddle River, Vin Vin, Logic Circuit Design, Cbit Cbit, Cin Cload, Cload Cin, Designer Per-spective, Gate Problem, Ref Clk, Vgsp Vdd, Journal of Solid-State Circuits, Morgan Kaufman Publishers, New Jersey, Optimizing Paths, Qox Cox, Reff Cload, San Francisco New!
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Front Cover | Table of Contents | First Pages | Index | Surprise Me!
Integrated circuits (ICs) are part of virtually every electronic component in the world today, such as cell phones, personal digital assistants, pagers, personal computers, printers, set-top boxes, automobiles, and so on. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
optimal stage effort, semiconductor memory design, saturated enhancement load, bitline capacitance, fanout capacitance, branching effort, load line construction, replica circuit, domino stage, threshold voltage equation, grounded capacitance, domino logic, electrical effort, third inverter, digital integrated circuits, logical effort, lateral capacitance, voltage transfer characteristics, identical inverters, interconnect issues, interconnect design, access transistors, wire capacitance, precharge phase, buffer insertion Key Phrases - Capitalized Phrases (CAPs): (learn more)
Kluwer Academic Publishers, Vin Vout, Vout Vout, Vout Vin, New York, Summary References Problems, Parameters Units, Second Edition, Upper Saddle River, Vin Vin, Logic Circuit Design, Cbit Cbit, Cin Cload, Cload Cin, Designer Per-spective, Gate Problem, Ref Clk, Vgsp Vdd, Journal of Solid-State Circuits, Morgan Kaufman Publishers, New Jersey, Optimizing Paths, Qox Cox, Reff Cload, San Francisco New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Surprise Me!
Citations (learn more)
This book cites 27
books:
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39
books
cite this book:
See all 39 books citing this book
- Digital Integrated Circuits (2nd Edition) by Jan M. Rabaey on 8 pages
- Emerging Memories: Technologies and Trends by Betty Prince on page 393, and page 436
- Principles of Digital Design by Daniel D. Gajski on page 32, and page 242
- Semiconductor Device Modeling by Giuseppe Massobrio on page 138
- Micromachined Transducers Sourcebook by Gregory T. Kovacs in Front Matter
See all 27 books this book cites
- CMOS Circuit Design, Layout, and Simulation by R. Jacob Baker on 6 pages
- Digital Integrated Circuit Design (The Oxford Series in Electrical and Computer Engineering) by Ken Martin on 6 pages
- Foundations of Materials Science and Engineering (McGraw-Hill Series in Materials Science) by William Smith on 5 pages
- The SPICE Book by Andrei Vladimirescu on page 140, and page 240
- Semiconductor Device Modeling by Giuseppe Massobrio in Back Matter (1), and Back Matter (2)
See all 39 books citing this book
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