This volume aims to clarify those techniques which use elementary particles as probes for gathering information about the compositional details of surfaces. For each technique, the book provides a description of the physical principle involved, the method of operation, the nature of information derived, the range of application, and the advantages and disadvantages of the currently used techniques. These are in turn grouped according to the nature of the incident radiation: electrons, photons, ions, or neutral particles. This state-of-the-art information will be useful for materials scientists, surface physicists and surface chemists.
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