Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.
Applied Scanning Probe Methods III: Characterization: v. 3
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From the reviews: "The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007
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Inside This Book
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Key Phrases - Statistically Improbable Phrases (SIPs):
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electrooptic microscopy, lubricant nanoparticles, nanopatterned polymers, surface height maps, bump statistics, diatom adhesive, colocasia leaf, physical contact area, magnetic tape industry, ferroelectric domain structure, strain shielding, subatomic features, servo pattern, backside coating, molecular rows, large asperities, optical profiler, alumina wafer, pentacene molecule, wear simulation, electrooptic response, dynamic force microscopy, multiple asperities, friction force microscopy, meniscus force Key Phrases - Capitalized Phrases (CAPs): (learn more)
Phys Rev Lett, Surf Sci, Appl Phys Lett, New York, Chem Phys, Vac Sci Technol, American Physical Society, Phys Chem, Nano Lett, Mater Res, Rev Sci Instrum, Scanning Probe Methods, Oxford University Press, Proc Natl Acad Sci, Tribol Lett, Adv Mater, Angew Chem, Cambridge University Press, Nat Mat, Proc Roy Soc, Rev Mod Phys, Soc London, Academic Press, Biol Chem, Coll Interf Sci New!
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electrooptic microscopy, lubricant nanoparticles, nanopatterned polymers, surface height maps, bump statistics, diatom adhesive, colocasia leaf, physical contact area, magnetic tape industry, ferroelectric domain structure, strain shielding, subatomic features, servo pattern, backside coating, molecular rows, large asperities, optical profiler, alumina wafer, pentacene molecule, wear simulation, electrooptic response, dynamic force microscopy, multiple asperities, friction force microscopy, meniscus force Key Phrases - Capitalized Phrases (CAPs): (learn more)
Phys Rev Lett, Surf Sci, Appl Phys Lett, New York, Chem Phys, Vac Sci Technol, American Physical Society, Phys Chem, Nano Lett, Mater Res, Rev Sci Instrum, Scanning Probe Methods, Oxford University Press, Proc Natl Acad Sci, Tribol Lett, Adv Mater, Angew Chem, Cambridge University Press, Nat Mat, Proc Roy Soc, Rev Mod Phys, Soc London, Academic Press, Biol Chem, Coll Interf Sci New!
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 9
books:
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- Differential Scanning Calorimetry of Polymers: Physics, Chemistry, Analysis, Technology (Ellis Horwood Series in Polymer Science and Technology) by V.A. Bershtein on page 127
- Noncontact Atomic Force Microscopy by S. Morita in Front Matter
- Electrons and Electromagnetic Fields in Nanometer-Scale Structures by Hitoshi Nejo in Front Matter
- Applied Scanning Probe Methods I (NanoScience and Technology) (v. 1) by Bharat Bhushan in Front Matter
- Introduction to Polymer Physics by Ulrich Eisele on page 127
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