This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.
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This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.
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1 of 1 people found the following review helpful:
5.0 out of 5 stars
BEST TEST BOOK,
By A Customer
This review is from: Built In Test for VLSI: Pseudorandom Techniques (Hardcover)
This is the best test book I have read. It covers all aspects of
BIST with emphasis on pseudorandom techniques. It does not cover as
much about testing as "Digital System Testing and Testable Design" but
it is well worth its price tag.
4.0 out of 5 stars
Great Digital test book,
By
This review is from: Built In Test for VLSI: Pseudorandom Techniques (Hardcover)
This is a great book written from professionals in the materia. I personally took the class with Dr. Savir and he is not only a great professor but this book is well worth purchasing.
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Inside This Book
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First Sentence:
Testing of digital circuits is a major portion of the effort in their design, production, and use. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
possible error polynomials, reconverging gate, boldfaced path, masking probability, path delay test, system data lines, random pattern testable, unequal inversion parities, random pattern testing, test generation effort, controllability values, sampling polynomial, dependency polynomial, cutting algorithm, possible error sequences, reconverging paths, signature dictionary, input signal probabilities, masking probabilities, capture clock, signature analyzer, random pattern testability, scan latches, fault detection probabilities, transition counting Key Phrases - Capitalized Phrases (CAPs): (learn more)
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Testing of digital circuits is a major portion of the effort in their design, production, and use. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
possible error polynomials, reconverging gate, boldfaced path, masking probability, path delay test, system data lines, random pattern testable, unequal inversion parities, random pattern testing, test generation effort, controllability values, sampling polynomial, dependency polynomial, cutting algorithm, possible error sequences, reconverging paths, signature dictionary, input signal probabilities, masking probabilities, capture clock, signature analyzer, random pattern testability, scan latches, fault detection probabilities, transition counting Key Phrases - Capitalized Phrases (CAPs): (learn more)
Chip Select New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 4
books:
- Fault-Tolerant Computing (Ftcs-21) in Back Matter (1), and Back Matter (2)
- Shift Register Sequences by Solomon W. Golomb in Back Matter
- A Survey of Modern Algebra (Akp Classics) by Garrett Birkhoff in Back Matter
- Digest of Papers by Compcon in Back Matter
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