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2 Reviews
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1 of 1 people found the following review helpful:
5.0 out of 5 stars
BEST TEST BOOK,
By A Customer
This review is from: Built In Test for VLSI: Pseudorandom Techniques (Hardcover)
This is the best test book I have read. It covers all aspects of
BIST with emphasis on pseudorandom techniques. It does not cover as
much about testing as "Digital System Testing and Testable Design" but
it is well worth its price tag.
4.0 out of 5 stars
Great Digital test book,
By
This review is from: Built In Test for VLSI: Pseudorandom Techniques (Hardcover)
This is a great book written from professionals in the materia. I personally took the class with Dr. Savir and he is not only a great professor but this book is well worth purchasing.
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Built In Test for VLSI: Pseudorandom Techniques by Paul H. Bardell (Hardcover - Oct. 1987)
$208.00
In stock but may require an extra 1-2 days to process. | |
 
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