Chemical-Mechanical Planarization: Volume 867: Integration, Technology and Reliability (MRS Proceedings) [Hardcover]

E. C. Johns (Editor), A. Kumar (Editor), J. A. Lee (Editor), Y. S. Obeng (Editor), I. Vos (Editor)

Book Description

Publication Date: July 19, 2005 | ISBN-10: 1558998209 | ISBN-13: 978-1558998209

Technology requirements associated with the progressive scaling of devices for future technology nodes, coupled with the aggressive introduction of new materials, places tremendous demands on chemical-mechanical polishing. The goal of this 2005 book, which is part of a popular series from MRS, is to bring together experts from a broad spectrum of research and technology groups currently working on CMP, to review advances made, and to offer a comprehensive discussion of future challenges that must be overcome. The book shows trends in the development of consumables, process modules, tool designs, process integration, modeling, defect characterization, and metrology. Topics include: planarization processes and applications; consumables -CMP pads and slurries; CMP equipment and metrology; and CMP modeling and simulation.

Editorial Reviews

Book Description

This 2005 book brings together experts from a broad spectrum of research and technology groups currently working on CMP, to review advances made, and to offer a comprehensive discussion of challenges that must be overcome. Topics include: planarization processes and applications; CMP equipment and metrology; and CMP modeling and simulation.

Product Details

• Hardcover: 302 pages
• Publisher: Materials Research Society (July 19, 2005)
• Language: English
• ISBN-10: 1558998209
• ISBN-13: 978-1558998209
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• Amazon Best Sellers Rank: #10,449,640 in Books (See Top 100 in Books)