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Chip On Board: Technology for Multichip Modules (E; Ectrical Engineering)
 
 
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Chip On Board: Technology for Multichip Modules (E; Ectrical Engineering) [Hardcover]

John H. Lau (Author)

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Book Description

0442014414 978-0442014414 January 15, 1994 1st
This book is a one-stop guide to the state of the art of COB technology. For professionals active in COB and MCM research and development, those who wish to master COB and MCM problem-solving methods, and those who must choose a cost-effective design and high-yield manufacturing process for their interconnect systems, here is a timely summary of progress in al aspects of this fascinating field.
It meets the reference needs of design, material, process, equipment, manufacturing, quality, reliability, packaging, and system engineers, and technical managers working in electronic packaging and interconnection.

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Inside This Book (learn more)
First Sentence:
The major trend in the electronics industry today is to make products more personal by making them lighter, smaller, thinner, shorter, and faster, while at the same time making them more friendly, functional, powerful, reliable, and less expensive.1-42 Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
wire bond pull test, ball bond shear strength, reflow gang, automated bonding process, solder bump structure, aluminum bump, destructive pull testing, quasi module, ball bond shear test, bond nugget, micron bump bonding method, typical manufacturing process flow, bonder manufacturer, test fault coverage, polymerization stress, temporary packaging, solder bumped flip chip, bump deformation, thermocompression bonding process, underfill encapsulation, yielded chips, lead bonding process, mean shear strength, wire bond pull strength, copper bumps
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Technology Conference, New York, Van Nostrand Reinhold, Electronic Components Conference, Solid State Technology, Tester Model, International Electronics Packaging Conference, Circuit World, International Manufacturing Technology Symposium, John Wiley, Square Chip Size, Test Conf, Electrochemical Publications, Token Ring, Board Figure, Academic Press, Ceramic Epoxy, Electronic Materials Handbook, Electronic Test, Far East, Journal of Electronic Materials, Materials Park, Semiconductor International, Ceramic None, International Electronic Manufacturing Technology Symposium
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