Key Phrases - Statistically Improbable Phrases (SIPs):
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testlet model, item selection and ability estimation, linear test forms, item score patterns, sequential mastery testing, testlet structure, expected true score, lth stimulus, excess local dependence, constrained adaptive testing, testlet effect, aberrant response behavior, proportional scoring, adaptive testing scheme, figural response items, adaptive mastery testing, innovative item types, posterior information matrix, exposure control parameters, item writing process, controlling item exposure, item exposure rates, automated test assembly, current ability estimate, total weighted deviations
Key Phrases - Capitalized Phrases (CAPs):
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Applied Psychological Measurement, Educational Testing Service, New York, Journal of Educational Measurement, False Alarm, National Council, Kluwer Academic Publishers, General Test, San Diego, Applied Measurement, Research Report, Law School Admission Council, University of Twente, Lawrence Erlbaum Associates, Eap Estimate, Psychometric Society, Graduate Record Examinations, Monte Carlo, Journal of the American Statistical Association, Military Testing Association, Sample Item, National Board of Medical Examiners, Iowa City, Armed Services Vocational Aptitude Battery, John Wiley
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