Key Phrases - Statistically Improbable Phrases (SIPs):
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wrapper terminals, wrapper interface port, wrapper reset, signal group names, active test mode, update storage element, wrapper cells, core scan chains, functional storage elements, wrapper bypass register, wrapper instruction register, multiple storage elements, external test mode, wrapper keyword, wrapper clock, parallel scan chains, test control signals, harness cells, harnessing logic, internal test mode, unwrapped core, register building blocks, single scan chain, compliant cores, scan enable signal
Key Phrases - Capitalized Phrases (CAPs):
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Wrapper User, Domain References, Inward Facing, Input Test, Pulse Low Min, Period Min, Pulse High Min, Daisy-chaining Figure, Output Func, Input Func, Drive Requirements, Instruction Scan, Required Allows, Test Access Port Figure
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