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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500(TM) (Frontiers in Electronic Testing)
 
 
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500(TM) (Frontiers in Electronic Testing) [Hardcover]

Francisco da Silva (Author), Teresa McLaurin (Author), Tom Waayers (Author)

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Book Description

July 20, 2006 0387307516 978-0387307510 1

The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500tm provides insight into the rules and recommendations of IEEE Std. 1500. This book focuses on practical design considerations inherent to the application of IEEE Std. 1500 by discussing design choices and other decisions relevant to this IEEE standard. The authors provide background information about some of the choices and decisions made throughout the design of IEEE Std. 1500.


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From the Back Cover

The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM

provides insight into the rules and recommendations of IEEE Std. 1500. The authors present background information about some of the choices and decisions made throughout the

design of this IEEE standard conceived to enable efficient core test reuse and debug at the

SOC level.

The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM focuses on practical design considerations and design choices inherent to the application of IEEE Std. 1500. This book teaches an engineer how to add a 1500 wrapper to their core in easy to understand steps. Starting with a bare core (a core without 1500 wrapper), the book progressively builds a 1500 compliant wrapper around this core while discussing overall requirements for each portion of the 1500 wrapper. The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM is a very valuable reference for professionals and researchers in the areas of design for test, design for test reuse/design reuse, and SOC implementation.


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Inside This Book (learn more)
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
wrapper terminals, wrapper interface port, wrapper reset, signal group names, active test mode, update storage element, wrapper cells, core scan chains, functional storage elements, wrapper bypass register, wrapper instruction register, multiple storage elements, external test mode, wrapper keyword, wrapper clock, parallel scan chains, test control signals, harness cells, harnessing logic, internal test mode, unwrapped core, register building blocks, single scan chain, compliant cores, scan enable signal
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Wrapper User, Domain References, Inward Facing, Input Test, Pulse Low Min, Period Min, Pulse High Min, Daisy-chaining Figure, Output Func, Input Func, Drive Requirements, Instruction Scan, Required Allows, Test Access Port Figure
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