or
Sign in to turn on 1-Click ordering.
or
Amazon Prime Free Trial required. Sign up when you check out. Learn More
Sell Back Your Copy
For a $2.52 Gift Card
Trade in
More Buying Choices
Have one to sell? Sell yours here
DSP-Based Testing of Analog and Mixed-Signal Circuits
 
 
Tell the Publisher!
I'd like to read this book on Kindle

Don't have a Kindle? Get your Kindle here, or download a FREE Kindle Reading App.

DSP-Based Testing of Analog and Mixed-Signal Circuits [Paperback]

Matthew Mahoney (Author)
3.5 out of 5 stars  See all reviews (2 customer reviews)

List Price: $78.95
Price: $66.26 & this item ships for FREE with Super Saver Shipping. Details
You Save: $12.69 (16%)
  Special Offers Available
o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o
In Stock.
Ships from and sold by Amazon.com. Gift-wrap available.
Want it delivered Wednesday, February 1? Choose One-Day Shipping at checkout. Details
Textbook Student FREE Two-Day Shipping for Students. Learn more


Book Description

0818607858 978-0818607851 April 27, 1987 1
Answers the commonly asked questions about how digital signal processing-based machines work and what role DSP plays in the process. It shows you how DSP performs in real-test situations and uses mathematical concepts rather than derivations. The text addresses difficult test problems and their solutions resulting from the union of automatic test equipment (ATE) and DSP. The author establishes a philosophy of DSP-based testing describing how to think, how to approach a problem, how to create a solution, and how to determine if it really works properly.

Special Offers and Product Promotions

  • Buy $50 in qualifying physical textbooks, get $5 in Amazon MP3 Credit. Here's how (restrictions apply)

Frequently Bought Together

Customers buy this book with Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library) $113.28

DSP-Based Testing of Analog and Mixed-Signal Circuits + Production Testing of RF and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library)
Price For Both: $179.54

Show availability and shipping details


Customers Who Bought This Item Also Bought


Product Details

  • Paperback: 272 pages
  • Publisher: Wiley-IEEE Computer Society Pr; 1 edition (April 27, 1987)
  • Language: English
  • ISBN-10: 0818607858
  • ISBN-13: 978-0818607851
  • Product Dimensions: 11 x 8.2 x 0.6 inches
  • Shipping Weight: 1.4 pounds (View shipping rates and policies)
  • Average Customer Review: 3.5 out of 5 stars  See all reviews (2 customer reviews)
  • Amazon Best Sellers Rank: #474,433 in Books (See Top 100 in Books)

 

Customer Reviews

2 Reviews
5 star:    (0)
4 star:
 (1)
3 star:
 (1)
2 star:    (0)
1 star:    (0)
 
 
 
 
 
Average Customer Review
3.5 out of 5 stars (2 customer reviews)
 
 
 
 
Share your thoughts with other customers:
Most Helpful Customer Reviews

1 of 1 people found the following review helpful:
3.0 out of 5 stars I envisaged scientists in leisure suits, but that is not really in the book, October 27, 2011
This review is from: DSP-Based Testing of Analog and Mixed-Signal Circuits (Paperback)
The book provides a rich historical account of the technology boom of a prehistoric silicon valley through the time that the book was written around the mid 1980's. It provides a first hand account of how the earliest test equipment dinosaurs for digital signal processing were tamed.

Therefore, in the context of solving problems related to digital signal processing one might anticipate that the author's information belongs to a bygone era. While that is true, in a different sense it provides the bread crumbs that lead to the original planning diagram for the box that everyone wants to think out of.

That is an accomplishment.

I would like to add these few observations, assuming that the author is never going to rewrite this book; I think that motivational research could be a good field of opportunity. Because when I finished his book, I was so motivated that if my pickup truck could have carried all of those stone tablets I would have taken this book to the semiconductor factory and showed them how it should be done.

Additionally, I enjoyed seeing the cave paintings of the mathematical concepts involved with digital signal processing and the stone carvings of the vacuum tubes were just amazing. However, what was most refreshing was finally finding an author that could explain that cave painting hieroglyphic depicting continuous analog signals. (c)
Help other customers find the most helpful reviews 
Was this review helpful to you? Yes No


1 of 3 people found the following review helpful:
4.0 out of 5 stars Good, But Needs a New Edition, January 22, 2004
This review is from: DSP-Based Testing of Analog and Mixed-Signal Circuits (Paperback)
This book was written in 1987, and many parts of it are still germane. The approach to solving DSP problems, and of testing DSP circuitry are timeless, as long as DSP circuits will exist.

What does need to be updated is text that reflects the massive gains in DSP complexity and speed since then. If anything, the debugging problems are much harder now, due to these hardware advances. In an industrial context, this is important because the Automated Test Equipment field has had to make massive investments in upgrading, to maintain its usefulness.

Overall, you can still find the book useful today, for its problem solving way of thinking.

Help other customers find the most helpful reviews 
Was this review helpful to you? Yes No

Share your thoughts with other customers: Create your own review
 
 
 
Only search this product's reviews



Inside This Book (learn more)
First Sentence:
In the last few years, digital signal processing (DSP) has profoundly altered the design and use of automatic test equipment (ATE). Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
tally vector, event digitizer, small crest factor, primitive frequency, rms input noise, unit test period, codec testing, multitone testing, multitone complex, band transfer function, coherent testing, gated sinusoid, primitive wave, integral linearity error, differential linearity error, transfer function estimation, nonrecursive digital filters, transfer function measurement, linear histogram, quantization distortion, superposition error, waveform synthesizer, test converter, code edges, code centers
Key Phrases - Capitalized Phrases (CAPs): (learn more)
International Test Conference
New!
Books on Related Topics | Concordance | Text Stats
Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Back Cover | Surprise Me!
Search Inside This Book:




Tag this product

 (What's this?)
Think of a tag as a keyword or label you consider is strongly related to this product.
Tags will help all customers organize and find favorite items.
Your tags: Add your first tag
 

Sell a Digital Version of This Book in the Kindle Store

If you are a publisher or author and hold the digital rights to a book, you can sell a digital version of it in our Kindle Store. Learn more

Customer Discussions

This product's forum
Discussion Replies Latest Post
No discussions yet

Ask questions, Share opinions, Gain insight
Start a new discussion
Topic:
First post:
Prompts for sign-in
 


Active discussions in related forums
Search Customer Discussions
Search all Amazon discussions
   
Related forums


Listmania!


Create a Listmania! list

So You'd Like to...


Create a guide


Look for Similar Items by Category


Look for Similar Items by Subject