This book introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy that are essential to determine microscopic defect structures. Many different magnetic resonance methods are required for investigating the microscopic and electronic properties of solids and uncovering correlations between those properties. In addition to EPR, such methods include electron nuclear double resonance (ENDOR), electronically and optically detected EPR (also known as ODENDOR), and electronically and optically detected ENDOR. This book comprehensively discusses experimental, technological, and theoretical aspects of these techniques from a practical point of view, with examples of semiconductors and insulators. While the non-specialist learns about the potential of the different methods, the researcher finds help in the application of commercial apparatus and guidance from ab initio theory for deriving structure models from data.
Point Defects in Semiconductors and Insulators
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This book introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy that are essential for applications used to determine microscopic defect structures. Many different magnetic resonance methods are required for investigating the microscopic and electronic properties of solids and uncovering correlations between those properties. In addition to EPR such methods include electron nuclear double resonance (ENDOR), electronically and optically detected EPR (the latter is known as ODENDOR), and electronically and optically detected ENDOR. This book comprehensively discusses experimental, technological, and theoretical aspects of these techniques from a practical point of view with many illustrative examples taken from semiconductors and insulators. The non-specialist is informed about the potential of the different methods. A researcher finds practical help in the application of commercial apparatus as well as useful guidance from ab initio theory for the task of deriving structure models from experimental data.
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Inside This Book
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First Sentence:
In the next section of this chapter, the term ''structure of point defects in solids" will be defined. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
pair recombination model, induced particle density, shf interactions, shf tensors, pair recombination luminescence, magnetic circular polarization, shf structure, unrelaxed excited states, four equivalent nuclei, thermal double donors, lif interaction, shunt center, pair recombination mechanism, total magnetization density, shf lines, neighbor nuclei, neighbor nucleus, induced electron density, line angular dependence, orbital singlet states, ground state polarization, solid state defects, state parabola, high microwave power levels, envelope function method Key Phrases - Capitalized Phrases (CAPs): (learn more)
Kohn Sham, Jahn Teller, Interactions Fig, Spectrometers Monitoring, Experimental Aspects of Optically Detected, Determination of Spin State, Basic Concepts of Defect Structure Determination, Electron Nuclear Nuclear Triple Resonance, Final Results Obtainable, Further Spin-Dependent Recombination Models, Spectra Table New!
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
In the next section of this chapter, the term ''structure of point defects in solids" will be defined. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
pair recombination model, induced particle density, shf interactions, shf tensors, pair recombination luminescence, magnetic circular polarization, shf structure, unrelaxed excited states, four equivalent nuclei, thermal double donors, lif interaction, shunt center, pair recombination mechanism, total magnetization density, shf lines, neighbor nuclei, neighbor nucleus, induced electron density, line angular dependence, orbital singlet states, ground state polarization, solid state defects, state parabola, high microwave power levels, envelope function method Key Phrases - Capitalized Phrases (CAPs): (learn more)
Kohn Sham, Jahn Teller, Interactions Fig, Spectrometers Monitoring, Experimental Aspects of Optically Detected, Determination of Spin State, Basic Concepts of Defect Structure Determination, Electron Nuclear Nuclear Triple Resonance, Final Results Obtainable, Further Spin-Dependent Recombination Models, Spectra Table New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 41
books:
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12
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- Solid State Physics: Advances in Research and Applications, Vol. 32 by Henry Ehrenreich on 9 pages
- Electron Paramagnetic Resonance by S. Geschwind on 5 pages
- Electron Paramagnetic Resonance of Transition Ions by A. Abragam in Back Matter (1), Back Matter (2), and Back Matter (3)
- Principles of Magnetic Resonance (Springer Series in Solid-State Sciences) (v. 1) by Charles P. Slichter in Back Matter (1), Back Matter (2), and Back Matter (3)
- Solid State Physics: Advances in Research and Applications, Vol. 44 by Henry Ehrenreich in Back Matter (1), Back Matter (2), and Back Matter (3)
See all 41 books this book cites
- Hartree-Fock-Slater Method for Materials Science: The DV-X Alpha Method for Design and Characterization of Materials (Springer Series in Materials Science) by Hirohiko Adachi in Front Matter
- Nondestructive Materials Characterization: With Applications to Aerospace Materials (Springer Series in Materials Science) by Norbert G. H. Meyendorf in Back Matter
- Predictive Simulation of Semiconductor Processing: Status and Challenges (Springer Series in Materials Science) by Jarek Dabrowski in Back Matter
- Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science) by Stefan Rein in Back Matter
- Dissipative Phenomena in Condensed Matter: Some Applications (Springer Series in Materials Science) by Sushanta Dattagupta in Back Matter
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