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Design and Test of Integrated Inductors for RF Applications
 
 
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Design and Test of Integrated Inductors for RF Applications [Hardcover]

Jaime Aguilera (Author), Roc Berenguer (Author)

Price: $165.00 & this item ships for FREE with Super Saver Shipping. Details
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Book Description

November 30, 2003 1402076762 978-1402076763 1
Intended for engineers who are starting out in the design of integrated inductors, this book describes the whole design flow, basic selection of the geometry and optimisation of the quality by redesigning the geometry, measurement and de-embedding and characterisation.

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Inside This Book (learn more)
First Sentence:
The fast growing of the wireless market has created an urgent demand for smaller and cheaper handsets with increased functionality and performance while still meeting the tight constraints for mass production within a short product life cycle. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
broken guard ring, fabricated inductors, applied skate, magnetically induced losses, thru standard, substrate shielding, integrated inductors, high quality inductors, coplanar probe, parasitic input capacitance, patterned ground shield, signal pad, different metal layers, tungsten probes, same inductance, capacitative coupling, rectangular conductors, silicon based technologies, phase noise performance, interconnect parasitics, spiral inductors, probe station, vector network analyzer, test fixture, track width
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