This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
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From the Back Cover
This widely-used textbook provides comprehensive, state-of-the-art coverage of digital systems testing and testable design.
Considered a definitive text in this area, the book includes in-depth discussions of the following topics:
Test generation
Fault modeling for classic and new technologies
Simulation
Fault simulation
Design for testability
Built-in self-test Diagnosis
All topics are covered extensively, from fundamental concepts to advanced techniques.
Successfully used world-wide at leading universities, the book is appropriate for graduate-level and senior-level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.
About the Author
Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.
Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.
Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.
Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.
Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.
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Most Helpful Customer Reviews
9 of 10 people found the following review helpful:
5.0 out of 5 stars
Comprahensive book for testing,
By A Customer
This review is from: Digital Systems Testing & Testable Design (Hardcover)
I am graduate student in VLSI testing. This book has everything from basics to latest testing techniques. No wonder that the authors took nore than 8 years to complete it. There is no other book in testing which is so comprehensive. If you are begginer or student with some experience in testing this book will best serve your needs.
1 of 1 people found the following review helpful:
5.0 out of 5 stars
controllability and observability,
By kaizen (Japan) - See all my reviews This book introduce very important concepts for testing. 9.3 Controllability and Observability is important concepts. If it is observable, it may not controllable. Testability, controllability and observability should be analized for testing. This book is good start point of testing.
1 of 1 people found the following review helpful:
5.0 out of 5 stars
good concepts for testing and testable design,
By kaizen (Japan) - See all my reviews
This review is from: Digital Systems Testing & Testable Design (Hardcover)
I am a engineer of automatic control.
This book introduces very important concepts for testing. The content is 1. Introduction 2. Modeling 3. Logic simulation 4. Fault modeling 5. Fault simulation 6. Testing for single stuck faults 7. testing for bridging faults 8. functional testing 9. design for testability 10. compression techniques 11. built in self test 12. logic level diagnosis 13. self checking design 14. PLA testing 15. system level diagnosis 9.3 Controllability and Observability is important concepts. If it is observable, it may not controllable. Testability, controllability and observability should be analized for testing. This book is good start point of testing. At 2010, 10th edition is printing.
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Inside This Book
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First Sentence:
Testing of a system is an experiment in which the system is exercised and its resulting response is analyzed to ascertain whether it behaved correctly. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
crosspoint faults, critical cubes, arbitrary delay model, critical path tracing, iterative array model, pseudoexhaustive testing, combinational equivalent, noncode inputs, fanout count, deductive simulation, fanout list, fanout branches, checkpoint faults, stem fault, masking probability, noncode word, universal test set, fault collapsing, percent fault coverage, unidirectional errors, one fanout, shrinkage fault, equality checker, reconvergent fanout, complete test set Key Phrases - Capitalized Phrases (CAPs): (learn more)
Test Conf, Digest of Papers, Computer-Aided Design, Design Automation Conf, Test of Computers, Annual Intn'l, Computer Design, Technical Report, Journal of Research, New York, Stanford University, Bell System Technical Journal, Deduction Algorithm, Journal of Design Automation, Proc Intn'l, Combinational Networks, Computer Science Press, Some Advanced, Combinational Logic Networks, Electronic Computers, Design Automation Corrf, Intn'l Conf, New Approach, Academic Press, Decisions Implications New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Testing of a system is an experiment in which the system is exercised and its resulting response is analyzed to ascertain whether it behaved correctly. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
crosspoint faults, critical cubes, arbitrary delay model, critical path tracing, iterative array model, pseudoexhaustive testing, combinational equivalent, noncode inputs, fanout count, deductive simulation, fanout list, fanout branches, checkpoint faults, stem fault, masking probability, noncode word, universal test set, fault collapsing, percent fault coverage, unidirectional errors, one fanout, shrinkage fault, equality checker, reconvergent fanout, complete test set Key Phrases - Capitalized Phrases (CAPs): (learn more)
Test Conf, Digest of Papers, Computer-Aided Design, Design Automation Conf, Test of Computers, Annual Intn'l, Computer Design, Technical Report, Journal of Research, New York, Stanford University, Bell System Technical Journal, Deduction Algorithm, Journal of Design Automation, Proc Intn'l, Combinational Networks, Computer Science Press, Some Advanced, Combinational Logic Networks, Electronic Computers, Design Automation Corrf, Intn'l Conf, New Approach, Academic Press, Decisions Implications New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 14
books:
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61
books
cite this book:
See all 61 books citing this book
- Digest of Papers by Compcon on 4 pages
- Star Wars Technical Journal by Shane Johnson on page 36, page 84, and page 173
- Artificial Intelligence by A. E. Nisenfedl on page 280, and page 566
- Digital Systems: Hardware Organization and Design by Frederick J. Hill in Front Matter, and page 36
- Shift Register Sequences by Solomon W. Golomb on page 450, and page 526
See all 14 books this book cites
- Memory, Microprocessor, and ASIC (Principles and Applications in Engineering) by Wai-Kai Chen on 4 pages
- Principles of Testing Electronic Systems by Samiha Mourad on 4 pages
- An Introduction to Mixed-Signal IC Test and Measurement (Oxford Series in Electrical and Computer Engineering) by Mark Burns on page 21, page 593, and page 594
- Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17) by M. Bushnell in Back Matter (1), and Back Matter (2)
- Research Perspectives and Case Studies in Systems Test and Diagnosis (Frontiers in Electronic Testing) by John W. Sheppard on page 101, and Back Matter
See all 61 books citing this book
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