ESD: Circuits and Devices [Hardcover]

Steven H. Voldman (Author)

Book Description

ISBN-10: 0470847549 | ISBN-13: 978-0470847541 | Publication Date: January 2, 2006 | Edition: 1

The scaling of semiconductor devices from sub-micron to nanometer dimensions is driving the need for understanding the design of electrostatic discharge (ESD) circuits, and the response of these integrated circuits (IC) to ESD phenomena.

ESD Circuits and Devices provides a clear insight into the layout and design of circuitry for protection against electrical overstress (EOS) and ESD.  With an emphasis on examples, this text:

• explains ESD buffering, ballasting, current distribution, design segmentation, feedback, coupling, and de-coupling ESD design methods;
• outlines the fundamental analytical models and experimental results for the ESD design of MOSFETs and diode semiconductor device elements, with a focus on CMOS, silicon on insulator (SOI), and Silicon Germanium (SiGe) technology;
• focuses on the ESD design, optimization, integration and synthesis of these elements and concepts into ESD networks, as well as applying within the off-chip driver networks, and on-chip receivers; and
• highlights state-of-the-art ESD input circuits, as well as ESD power clamps networks.

Continuing the author’s series of books on ESD, this book will be an invaluable reference for the professional semiconductor chip and system ESD engineer.  Semiconductor device and process development, quality, reliability and failure analysis engineers will also find it an essential tool.  In addition, both senior undergraduate and graduate students in microelectronics and IC design will find its numerous examples useful.

Editorial Reviews

From the Back Cover

The scaling of semiconductor devices from sub-micron to nanometer dimensions is driving the need for understanding the design of electrostatic discharge (ESD) circuits, and the response of these integrated circuits (IC) to ESD phenomena.

ESD Circuits and Devices provides a clear insight into the layout and design of circuitry for protection against electrical overstress (EOS) and ESD.  With an emphasis on examples, this text:

• explains ESD buffering, ballasting, current distribution, design segmentation, feedback, coupling, and de-coupling ESD design methods;
• outlines the fundamental analytical models and experimental results for the ESD design of MOSFETs and diode semiconductor device elements, with a focus on CMOS, silicon on insulator (SOI), and Silicon Germanium (SiGe) technology;
• focuses on the ESD design, optimization, integration and synthesis of these elements and concepts into ESD networks, as well as applying within the off-chip driver networks, and on-chip receivers; and
• highlights state-of-the-art ESD input circuits, as well as ESD power clamps networks.

Continuing the author’s series of books on ESD, this book will be an invaluable reference for the professional semiconductor chip and system ESD engineer.  Semiconductor device and process development, quality, reliability and failure analysis engineers will also find it an essential tool.  In addition, both senior undergraduate and graduate students in microelectronics and IC design will find its numerous examples useful.

About the Author

Dr. Steven H. Voldman received his B. S. in Engineering Science from the University of Buffalo (1979); M.S. EE (1981) and Electrical Engineer Degree (1982) from M.I.T.; MS Engineering Physics (1986) and Ph.D. EE (1991) from the University of Vermont under IBM Resident Study Fellow program. At M.I.T., he worked as a member of the M.I.T. Plasma Fusion center, and the High Voltage Research Laboratory (HVRL). At IBM, as a reliability/device engineer, his work included pioneering work in bipolar/CMOS SRAM alpha particle and cosmic ray SER simulation, MOSFET gate-induced drain leakage (GIDL) mechanism, hot electron, epitaxy/well design, CMOS latchup, and ESD. Since 1986, he was responsible for defining the IBM ESD/latchup strategy for CMOS, SOI, BiCMOS and RF CMOS, and SiGe technologies. He has authored ESD and latchup publications in the area of MOSFET scaling, device simulation, copper, low-k, MR heads, CMOS, SOI, SiGe and SiGeC technology. Voldman served as SEMATECH ESD Working Group Chairman (1996–2000), ESD Association Technical Program Chair (2000), Vice Chairman (2001), General Chairman 2002, and ESDA Board of Directors (1998–2006), International Reliability Physics Symposium ESD/Latchup Sub-Committee Chairman (2002–2006), International Physical and Failure Analysis (IPFA) Symposium ESD Sub-Committee Chairman (2003–2005), ESD Association Standard Development Chairman on Transmission Line Pulse Testing (2000–2006), ESD International Committee on Education (ICE) Asian University Liason and “ESD on Campus” program founder, and serves in the ISQED Committee, Taiwan ESD Conference (T-ESDC) Technical Program Committee (Hsinchu, Taiwan), and the International Conference on Electromagnetic Compability (ICEMAC, Taipei, Taiwan). Voldman has provided ESD lectures for universities (e.g., M.I.T. Lecture Series, Taiwan National Chiao-Tung University (NCTU), and Singapore Nanyang Technical University (NTU)). He is a recipient of over 136 U.S. patents, over 100 publications, and recently wrote a textbook on ESD entitled ESD: Physics and Devices (John Wiley and Sons, Ltd) as well as contributing to the text “Silicon Germanium: Modeling, Technology and Simulation,” and providing talks on patenting and invention. He has been highlighted in EE Times, Intellectual Property Law and Business and authored the first article on ESD phenomena for the October 2002 edition of Scientific American entitled “Lightning Rods for Nano-electronics,” and Pour La Science, Le Scienze, and Swiat Nauk International editions. In 2003, Dr. Voldman was accepted as the first IEEE Fellow for ESD phenomena in semiconductors for “contributions to electrostatic discharge protection in CMOS, SOI, and SiGe technologies.”

Product Details

• Hardcover: 412 pages
• Publisher: Wiley; 1 edition (January 2, 2006)
• Language: English
• ISBN-10: 0470847549
• ISBN-13: 978-0470847541
• Product Dimensions: 9.9 x 6.8 x 1.1 inches
• Shipping Weight: 1.4 pounds (View shipping rates and policies)
• Average Customer Review: 5.0 out of 5 stars  See all reviews (5 customer reviews)
• Amazon Best Sellers Rank: #1,124,648 in Books (See Top 100 in Books)

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Customer Reviews

Most Helpful Customer Reviews

2 of 2 people found the following review helpful:

5.0 out of 5 stars Great series for ESD education, January 18, 2008

By 

Chen (California, USA) - See all my reviews

This review is from: ESD: Circuits and Devices (Hardcover)

This book, ESD: Circuits and Devices, is part of a 3-book series on Electrostatic Discharge (ESD) by the same author (Steven Voldman).

One of the main strengths of this series (and there are very many) is that this is very recently published with new and updated datapoints, not to mention being the only series of ESD textbook. Essentially, this means that all the latest developments in the field is published in an easy-to-understand series.

In this book, Voldman writes about the design of ESD protection circuits in his unique style which is illuminating both for experts and beginners alike. I highly recommend this book series to all students of integrated circuit design and ESD.

1 of 1 people found the following review helpful:

5.0 out of 5 stars A very useful ESD book about devices and circuits, January 23, 2008

By 

lalafa (Orlando, Florida, USA) - See all my reviews

This review is from: ESD: Circuits and Devices (Hardcover)

I have already had this book for a while. This one is the second book of the author's ESD book series which cover the most comprehensive topics related to ESD protection comparing with other ESD books. It is one of the most recently published ESD books with new and updated date points and the latest developments in the field. The thing I like most is, just like the name (circuits and devices) of the book, it not only takes the ESD protection devices as topics to present all the ESD design issues, but also takes the circuit applications as topics to discuss the concerns of ESD design, which gives you the picture that only with good individual ESD protection devices, the successful full-chip ESD solution is not automatic. It is a useful book for both designers and device engineers. I always keep it at hand for my ESD design projects.

5.0 out of 5 stars Highly recommended to circuit designers and students, February 20, 2011

By 

VC - See all my reviews

This review is from: ESD: Circuits and Devices (Hardcover)

This is one of the best books on ESD. All the major ESD building blocks and issues are fully investigated and elegantly written. A perfect balance between circuit and device is an important feature of this book. This is the second book of this series and the author obviously devoted a tremendous amount of time and effort to the writing. The treatment is comprehensive enough to make this book the textbook for an ESD course. It's worth noting that the author is a world expert on ESD and integrated circuit technologies, and was named an IEEE fellow for his contributions in these areas. It's great that he shared lots of valuable knowledge, design experience and deep insights. Chapters 3 and 4 help readers quickly gain solid understanding of the two key elements in ESD design domain: MOSFET and diodes. The chapters on driver, receiver, and power clamp help complete the knowledge of ESD building blocks. All these chapters are written from circuit design perspective rather than pure device physics. Chapters focusing on SOI are a big plus. There are plenty of helpful illustrations in this book, and the perfect number of equations to enhance readers understanding. Please consider using this as your first book to read in ESD. You will keep referring to this book many years from now. Engineers with lots of experience would find this book very useful as well.