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Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs (Artech House Microwave Library)
 
 
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Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs (Artech House Microwave Library) [Hardcover]

Robert Anholt (Author)


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Book Description

November 30, 1994 089006749X 978-0890067499
Presents observations and an analysis of the way III-V transistor electrical characteristics change with the operating temperature and , through device self-heating, with the power dissipation. DLC: Field effect transistors.

Product Details

  • Hardcover: 324 pages
  • Publisher: Artech Print on Demand (November 30, 1994)
  • Language: English
  • ISBN-10: 089006749X
  • ISBN-13: 978-0890067499
  • Product Dimensions: 9.3 x 6.3 x 0.9 inches
  • Shipping Weight: 1.3 pounds
  • Amazon Best Sellers Rank: #3,505,971 in Books (See Top 100 in Books)

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Inside This Book (learn more)
First Sentence:
This book presents observations and an analysis of the way III-V transistor electrical characteristics change with the operating temperature and, through device self-heating, with the power dissipation. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
electron saturated velocity, nonstationary electron dynamics, barrier height shift, pinchoff voltage, emitter stack, high gate voltages, thermal subcircuit, chuck temperature, gate voltage curves, total gate capacitance, high drain voltages, low drain voltages, low gate voltages, large drain voltages, saturated electron velocity, pad capacitances, increasing drain voltage, curve droop, large gate voltages, recess etched, thermal impedance, drain temperatures, transconductance curves, drain biases, lightly doped collector
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Gate Voltage Figure, Cascade Microtech, New York, Artech House, Monte Carlo, Solid State Elect, Base-Emitter Voltage Figure, Compact Software's Microwave Harmonica, Elect Dev, Physics of Semiconductor Devices, Alta Frequenzia, Fundamental Studies of Interfaces
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