Electron Energy-Loss Spectroscopy in the Electron Microscope (Topics in Geobiology) [Hardcover]

R.F. Egerton (Author)

Book Description

Publication Date: May 31, 1996 | ISBN-10: 0306452235 | ISBN-13: 978-0306452239 | Edition: 2nd

The Second Edition explores several new applications of EELS developed during the last ten years. The chapters include recent progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. This edition also features updated computer programs which will perform spectrum deconvolution and compute partial ionization cross-sections.

Editorial Reviews

Review

Reviews of the Second Edition:

`The text....contains a wealth of practical detail and experimental insight....This book is an essential purchase for any microscopist who is using, or planning to use, electron spectroscopy or spectroscopic imaging.' -- JMSA

`Provides the advanced student with an indispensible text and the experienced researcher with a valuable reference.' -- American Scientist

From the Back Cover

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.  In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data. Considered the "Bible of EELS"Presents the only in-depth, single-author text for the still-expanding field of TEM-EELSResponds to many requests for the first new edition of this classic work since 1996Includes discussion of new spectrometer and detector designs, together with spectral-analysis techniques such as Bayesian deconvolution and multivariate statistical analysisProvides extended discussion of anisotropic materials, retardation effects, delocalization of inelastic scattering, and the simulation of energy-loss fine structure.Describes recent applications of EELS to fields such as nanotechnology, electronic devices and carbon-based materials.Offers extended coverage of radiation damage and delocalization as limits to spatial resolution.From reviews of the first and second edition: "The text....contains a wealth of practical detail and experimental insight....This book is an essential purchase for any microscopist who is using, or planning to use, electron spectroscopy or spectroscopic imaging." – JMSA "Provides the advanced student with an indispensible text and the experienced researcher with a valuable reference." -- American Scientist --This text refers to an alternate Hardcover edition.

Product Details

• Hardcover: 500 pages
• Publisher: Springer; 2nd edition (May 31, 1996)
• Language: English
• ISBN-10: 0306452235
• ISBN-13: 978-0306452239
• Product Dimensions: 9.5 x 6.4 x 1.3 inches
• Shipping Weight: 1.9 pounds (View shipping rates and policies)
• Average Customer Review: 5.0 out of 5 stars  See all reviews (1 customer review)
• Amazon Best Sellers Rank: #270,304 in Books (See Top 100 in Books)
  • #11 in Books > Professional & Technical > Professional Science > Physics > Electron Microscopy
  • #58 in Books > Professional & Technical > Professional Science > Chemistry > Analytic

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Customer Reviews

Most Helpful Customer Reviews

4 of 4 people found the following review helpful:

5.0 out of 5 stars A comprehensive overview of EELS in TEM, October 8, 2010

By 

Ulfilas (Washington, DC) - See all my reviews

This review is from: Electron Energy-Loss Spectroscopy in the Electron Microscope (Topics in Geobiology) (Hardcover)

For as long as I can remember, Ray Egerton has been at the forefront of electron energy loss spectroscopy (EELS) in the transmission electron microscope (TEM). For those who want to find out more about EELS and its ability to map composition at a nanometer scale (especially for low Z elements), this book is probably the best place to start. In addition to describing such instrumentation as magnetic prisms and lenses, the author provides a review of elastic and inelastic scattering theory. Inelastic scattering, as the key to understanding EELS, and the source of the features in the EELS spectrum, is broken down into plasmons (both bulk and surface) and the characteristic atomic excitations that lead to absorption edges. Bethe's theory of energy loss from characteristic atomic excitations is laid out in sufficient detail, as is the formulation of EELS spectra in terms of the complex dielectric constant. Inelastic scattering theory is, in turn, used by the author to calculate the spatial resolution of this technique as a function of the incident electron energy and the electron energy loss.

If you want to get a taste of what this book is like, I would suggest that you read Egerton's review article in Rep. Prog. Phys. 72 (2009) 016502 as well as his article in Ultramicroscopy 4 (1979) 169.