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Electron Energy-Loss Spectroscopy in the Electron Microscope Hardcover – July 29, 2011

ISBN-13: 978-1441995827 ISBN-10: 144199582X Edition: 3rd ed. 2011

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Electron Energy-Loss Spectroscopy in the Electron Microscope + Scanning Transmission Electron Microscopy: Imaging and Analysis + Aberration-corrected Imaging in Transmission Electron Microscopy: An Introduction
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Editorial Reviews


From the reviews of the third edition:

“R.F. Egerton’s Electron Energy-loss Spectroscopy in the Electron Microscope is the standard text on the subject … . The book is now very up-to-date; R.F. Egerton has clearly continued adding to the text and references up to the last minute … . Springer have printed the book beautifully, with colour in place when needed and the references now give full details … . EEL spectroscopists … cannot do without this new edition.” (Ultramicroscopy, Vol. 116, 2012)

From the Back Cover

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.  In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.

  • Considered the "Bible of EELS"
  • Presents the only in-depth, single-author text for the still-expanding field of TEM-EELS
  • Responds to many requests for the first new edition of this classic work since 1996
  • Includes discussion of new spectrometer and detector designs, together with spectral-analysis techniques such as Bayesian deconvolution and multivariate statistical analysis
  • Provides extended discussion of anisotropic materials, retardation effects, delocalization of inelastic scattering, and the simulation of energy-loss fine structure.
  • Describes recent applications of EELS to fields such as nanotechnology, electronic devices and carbon-based materials.
  • Offers extended coverage of radiation damage and delocalization as limits to spatial resolution.

From reviews of the first and second edition:

"The text....contains a wealth of practical detail and experimental insight....This book is an essential purchase for any microscopist who is using, or planning to use, electron spectroscopy or spectroscopic imaging." – JMSA

"Provides the advanced student with an indispensible text and the experienced researcher with a valuable reference." -- American Scientist


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Product Details

  • Hardcover: 491 pages
  • Publisher: Springer; 3rd ed. 2011 edition (July 29, 2011)
  • Language: English
  • ISBN-10: 144199582X
  • ISBN-13: 978-1441995827
  • Product Dimensions: 9.1 x 6.3 x 1.3 inches
  • Shipping Weight: 2.5 pounds (View shipping rates and policies)
  • Average Customer Review: 5.0 out of 5 stars  See all reviews (1 customer review)
  • Amazon Best Sellers Rank: #2,524,992 in Books (See Top 100 in Books)

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Most Helpful Customer Reviews

6 of 6 people found the following review helpful By Ulfilas on October 8, 2010
Format: Hardcover
For as long as I can remember, Ray Egerton has been at the forefront of electron energy loss spectroscopy (EELS) in the transmission electron microscope (TEM). For those who want to find out more about EELS and its ability to map composition at a nanometer scale (especially for low Z elements), this book is probably the best place to start. In addition to describing such instrumentation as magnetic prisms and lenses, the author provides a review of elastic and inelastic scattering theory. Inelastic scattering, as the key to understanding EELS, and the source of the features in the EELS spectrum, is broken down into plasmons (both bulk and surface) and the characteristic atomic excitations that lead to absorption edges. Bethe's theory of energy loss from characteristic atomic excitations is laid out in sufficient detail, as is the formulation of EELS spectra in terms of the complex dielectric constant. Inelastic scattering theory is, in turn, used by the author to calculate the spatial resolution of this technique as a function of the incident electron energy and the electron energy loss.

If you want to get a taste of what this book is like, I would suggest that you read Egerton's review article in Rep. Prog. Phys. 72 (2009) 016502 as well as his article in Ultramicroscopy 4 (1979) 169.
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