Amazon.com: Electron Microscopy of Materials: An Introduction (Material science and technology series) (9780127251509): Manfred Von Heimendahl, A. S. Norwick: Books

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Electron Microscopy of Materials: An Introduction (Material science and technology series) [Hardcover]

Manfred Von Heimendahl (Author), A. S. Norwick (Editor)


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Language Notes

Text: English, German (translation)

Product Details

  • Hardcover: 228 pages
  • Publisher: Academic Press (January 11, 1981)
  • Language: English
  • ISBN-10: 0127251502
  • ISBN-13: 978-0127251509
  • Product Dimensions: 8.9 x 6 x 0.6 inches
  • Shipping Weight: 1.2 pounds
  • Amazon Best Sellers Rank: #1,973,219 in Books (See Top 100 in Books)

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Inside This Book (learn more)
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
foil thickness determination, coincidence ambiguity, oblique shadowing, electrolytic thinning, first secondary maximum, reflecting lattice planes, wedge fringes, latex balls, kinematical theory, lens defects, twin axis, electrolytic polishing, dislocation image, ion thinning, point cathodes, intermediate lens, bend contours, real lattice, objective aperture, dislocation contrast, extinction distance, crystal lattice planes, magnetic rotation, orientation determination, twinning plane
Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Status Solidi, Acta Metall, Arta Metall
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