This book includes an introduction to some important reliability concepts and a review of terminology. The work is divided into three sections: modelling, evaluation and assurance.
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Using a unique approach, the author examines both reliability physics and reliability statistics to reveal how they can be employed in order to discover why components fail and how failures develop over time. The text introduces several important reliability concepts and then divides into three key areas--modelling, evaluation and assurance.
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Inside This Book
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First Sentence:
The study of electronic component reliability invariably involves the study of both reliability physics and of reliability statistics. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
freak loads, proactive process control, component strength distribution, infant mortality subpopulation, wearout distribution, competing failure mechanisms, weak subpopulation, integrated circuit failure mechanisms, superimposed renewal process, field failure studies, infant mortality distribution, component failure mechanisms, infant mortality components, loading roughness, extrinsic failures, lifetest results, component hazard rate, mixed exponential distribution, contact electromigration, particular failure mechanism, term wearout, early field failures, semiconductor device reliability, accelerated lifetests, component robustness Key Phrases - Capitalized Phrases (CAPs): (learn more)
Engineering International, John Wiley, New York, International Reliability Physics Symposium, Intel Corporation, Maintainability Symposium, Marcel Dekker, Reliability Manual, Practical Reliability Engineering, Artech House, Elsevier Science Ltd, Engineering Design, Harris Corporation, Van Nostrand Reinhold, British Telecom, Design of Experiments, Langford Lane, Mechanical Reliability, Mitsubishi Electric, Semiconductor Manufacturing, The Boulevard New!
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
The study of electronic component reliability invariably involves the study of both reliability physics and of reliability statistics. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
freak loads, proactive process control, component strength distribution, infant mortality subpopulation, wearout distribution, competing failure mechanisms, weak subpopulation, integrated circuit failure mechanisms, superimposed renewal process, field failure studies, infant mortality distribution, component failure mechanisms, infant mortality components, loading roughness, extrinsic failures, lifetest results, component hazard rate, mixed exponential distribution, contact electromigration, particular failure mechanism, term wearout, early field failures, semiconductor device reliability, accelerated lifetests, component robustness Key Phrases - Capitalized Phrases (CAPs): (learn more)
Engineering International, John Wiley, New York, International Reliability Physics Symposium, Intel Corporation, Maintainability Symposium, Marcel Dekker, Reliability Manual, Practical Reliability Engineering, Artech House, Elsevier Science Ltd, Engineering Design, Harris Corporation, Van Nostrand Reinhold, British Telecom, Design of Experiments, Langford Lane, Mechanical Reliability, Mitsubishi Electric, Semiconductor Manufacturing, The Boulevard New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 24
books:
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1
book
cites this book:
- Reliability Engineering by arinc research corporation on 5 pages
- Accelerated Testing by Nelson on 5 pages
- Reliability in Engineering Design by Kailash C. Kapur on 4 pages
- Mechanical Reliability by A. D. S. Carter on page 72, page 132, and page 195
- Statistical Analysis in Chemistry and the Chemical Industry by carl bennett in Back Matter (1), and Back Matter (2)
See all 24 books this book cites
- Statistical Methods for Reliability Data (Wiley Series in Probability and Statistics) by William Q. Meeker in Back Matter
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