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Ellipsometry and Polarized Light (North-Holland Personal Library) Paperback – August 15, 1988

ISBN-13: 978-0444870162 ISBN-10: 0444870164 Edition: 3rd reprint 1999

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Product Details

  • Series: North-Holland Personal Library
  • Paperback: 558 pages
  • Publisher: North Holland; 3rd reprint 1999 edition (August 15, 1988)
  • Language: English
  • ISBN-10: 0444870164
  • ISBN-13: 978-0444870162
  • Product Dimensions: 1 x 6 x 9 inches
  • Shipping Weight: 2.2 pounds
  • Average Customer Review: 5.0 out of 5 stars  See all reviews (3 customer reviews)
  • Amazon Best Sellers Rank: #1,966,926 in Books (See Top 100 in Books)

Editorial Reviews

Review

(The authors) are to be commended on the further, major contribution to polarized light and its applications represented by this excellent book.

Physics Today
This book is carefully done... a serious and thorough effort that can be recommended to the expert in the field and the newcomer.


Applied Optics

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Customer Reviews

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2 of 2 people found the following review helpful By L. Lavagnino on August 9, 2005
Format: Paperback
In the last years ellipsometry has gained an important place in material science, due to the possibility of measuring optical properties of materials.

In this book the authors give a complete overview of this technique, starting from the principles of polarized light up to a deep threatment of ellipsometry (theory and applications) and its unique features in the field of surface and thin films phenomena.

A book that must be in a serious library of solid state physics, optics and physical chemistry.
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4 of 5 people found the following review helpful By schaieb@lauca.usach.cl on July 21, 1998
Format: Paperback
This book is a very good guide of how to use ellipsometry to probe interfaces and thin films (one can measure film thicknesses with an outstanding resolution). It shows that the simple fact that a change in the polarization of light can be a good probe for several systems (such as film growth and liquid-liquid interfaces). I would have liked however, if there were some information of how one can measure mechanical properties of a thin fluctuating liquid film using phase modulated ellipsometry.
I liked the book and is my bible whenever I want to do such experiments.
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4 of 8 people found the following review helpful By A Customer on November 28, 1996
Format: Paperback
Very good treatment of polarimeters, polarization calculii, and thin films. Solid mathematical treatment. Good for students
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