or
Sign in to turn on 1-Click ordering.
or
Amazon Prime Free Trial required. Sign up when you check out. Learn More
More Buying Choices
Have one to sell? Sell yours here
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing)
 
 
Tell the Publisher!
I'd like to read this book on Kindle

Don't have a Kindle? Get your Kindle here, or download a FREE Kindle Reading App.

Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing) [Hardcover]

Mohammad Tehranipoor (Author, Editor)

List Price: $189.00
Price: $81.20 & this item ships for FREE with Super Saver Shipping. Details
You Save: $107.80 (57%)
  Special Offers Available
o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o
In Stock.
Ships from and sold by Amazon.com. Gift-wrap available.
Only 2 left in stock--order soon (more on the way).
Want it delivered Monday, January 30? Choose One-Day Shipping at checkout. Details
Textbook Student FREE Two-Day Shipping for Students. Learn more

Formats

Amazon Price New from Used from
Hardcover $81.20  
Paperback $189.00  

Book Description

038774746X 978-0387747460 December 10, 2007 1

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.


Special Offers and Product Promotions

  • Buy $50 in qualifying physical textbooks, get $5 in Amazon MP3 Credit. Here's how (restrictions apply)

Editorial Reviews

From the Back Cover

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

Product Details


Customer Reviews


There are no customer reviews yet.
Video reviews
Video reviews
Amazon now allows customers to upload product video reviews. Use a webcam or video camera to record and upload reviews to Amazon.



Inside This Book (learn more)
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
primary output, molecular electronics, quantum cellular automata, crossbar graph, molecular nanofabrics, multiple faulty modules, coplanar crossing, test resource optimization, nanofabric model, redundancy insertion methodology, defective crossbar, qca circuits, clique energy function, clocking zones, test hardware overhead, eulerized graph, maximum biclique, nanofabric architecture, molecular latches, microfluidic array, test planning problem, fault free module, digital microfluidic biochips, crossbar circuits, original crossbar
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Correct Correct, Towards Nanoelectronics Processor Architectures, Markov Random Fields, Crossbar Array Nano-Architectures, Defect-Tolerant Logic, Test Conf, Nanoscale Crossbar Circuits, Testing Nanofabrics, Fault-Tolerant Molecular Computing Systems, Cellular Array-Based Delay-Insensitive Asynchronous Circuits, Designing Based, New York, Journal of Applied Physics, Primary Input, Test Symp, Computer Architecture, Applied Physics Letters, Clock Zone Fig, Reed Muller, International Conference, Missing Faulty, International Symposium, San Francisco, End of the Roadmap, Electron Devices
Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Surprise Me!
Search Inside This Book:

Tag this product

 (What's this?)
Think of a tag as a keyword or label you consider is strongly related to this product.
Tags will help all customers organize and find favorite items.
Your tags: Add your first tag
 

Sell a Digital Version of This Book in the Kindle Store

If you are a publisher or author and hold the digital rights to a book, you can sell a digital version of it in our Kindle Store. Learn more

Customer Discussions

This product's forum
Discussion Replies Latest Post
No discussions yet

Ask questions, Share opinions, Gain insight
Start a new discussion
Topic:
First post:
Prompts for sign-in
 


Active discussions in related forums
Search Customer Discussions
Search all Amazon discussions
   
Related forums


Listmania!


Create a Listmania! list

So You'd Like to...


Create a guide


Look for Similar Items by Category


Look for Similar Items by Subject