Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.
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This book is good but far too expensive. It puts a strain on the students.
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Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in material science for the characterization of surfaces, interfaces, and thin films. This flagship volume in the Materials Characterization series is a unique, stand-alone reference for materials science practitioners, process engineers, students, and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book is also a practical compnanion to the other books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.
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4 of 4 people found the following review helpful:
4.0 out of 5 stars
Materials Characterization Overview,
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This review is from: Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series) (Hardcover)
I purchased the book to help me better understand materials characterization for semiconductors. The book covers 50 materials characterization techniques, each of which is summarized in a single page at the beginning of the book. The book is then divided chapter by chapter for imaging techniques, electron beam instruments, diffractions, electron/x ray emission, visible, vibrational spectroscopies, ion scattering and mass spectroscopies, each written by an expert in the field.
Although the chapters follow a similar format, some of them lack important aspects of characterization: Some chapter may not give adequate examples of a typical spectra, or others may be short on instrumentation. Because of the limit of space given for each characterization method, the authors had to balance width with depth, and the scale sometimes tipped to width. Notwithstanding the shortcomings of the book, it has been extremely useful to understand the basics of each characterization method, thus I gave it a 4 star rating. I am also reading a related book "Scanning Electron Microscopy and X ray Microanalysis" by Goldstein, a book on SEM related techniques, and finding that the book has excellent width and depth, and very clear in its presentation
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Inside This Book
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First Sentence:
Though a wide range of analytical techniques is covered in this volume there are certain traits common to many of them. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
optical scatterometry, grazing geometry, depth profiling mode, positive ion yield, positive mass spectrum, extreme surface sensitivity, depth probed, secondary ion intensity, chemical state analysis, quantitative depth profiling, microbeam systems, other diffraction techniques, chemical state information, elemental coverage, excellent depth resolution, laser ionization mass spectrometry, energy loss peaks, backscattering signal, backscattering atoms, chemical bonding information, vacuum compatible, poorer detection limits, neutron reflectivity, recoil spectrometry, high surface sensitivity Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Related Articles, Academic Press, Plenum Press, Analytical Electron Microscopy, John Wiley, Monte Carlo, Rutherford Backscattering Spectrometry, Thin Solid Films, Destructive No Chemical, Inductively Coupled Plasma Mass Spectrometry, Los Alamos National Laboratory, Quantification Standards, San Francisco, Surface Sci, Glow-Discharge Mass Spectrometry, Optical Emission Spectroscopy, Reflected Electron Energy-Loss Spectroscopy, Scanning Force Microscopy, Auger Electron Diffraction, Convergent Beam Electron Diffraction, North Holland, Pergamon Press, Spark Source Mass Spectrometry, Materials Research Society New!
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Though a wide range of analytical techniques is covered in this volume there are certain traits common to many of them. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
optical scatterometry, grazing geometry, depth profiling mode, positive ion yield, positive mass spectrum, extreme surface sensitivity, depth probed, secondary ion intensity, chemical state analysis, quantitative depth profiling, microbeam systems, other diffraction techniques, chemical state information, elemental coverage, excellent depth resolution, laser ionization mass spectrometry, energy loss peaks, backscattering signal, backscattering atoms, chemical bonding information, vacuum compatible, poorer detection limits, neutron reflectivity, recoil spectrometry, high surface sensitivity Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Related Articles, Academic Press, Plenum Press, Analytical Electron Microscopy, John Wiley, Monte Carlo, Rutherford Backscattering Spectrometry, Thin Solid Films, Destructive No Chemical, Inductively Coupled Plasma Mass Spectrometry, Los Alamos National Laboratory, Quantification Standards, San Francisco, Surface Sci, Glow-Discharge Mass Spectrometry, Optical Emission Spectroscopy, Reflected Electron Energy-Loss Spectroscopy, Scanning Force Microscopy, Auger Electron Diffraction, Convergent Beam Electron Diffraction, North Holland, Pergamon Press, Spark Source Mass Spectrometry, Materials Research Society New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 70
books:
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2
books
cite this book:
- Secondary Ion Mass Spectrometry: SIMS VII by A. Benninghoven in Front Matter (1), Front Matter (2), and page 585
- Advances in X-Ray Analysis, Vol. 33 by Charles S. Barrett on page 213, page 348, and page 369
- Scanning Electron Microscopy and X-ray Microanalysis by Joseph Goldstein on page 83, and page 190
- Practical Analytical Electron Microscopy in Materials Science on page 134, and page 173
- Introduction to Analytical Electron Microscopy by John Hren on page 114, and page 173
See all 70 books this book cites
- Thin-Film Deposition: Principles and Practice by Donald Smith on page 587
- Sample Preparation Techniques in Analytical Chemistry by Somenath Mitra on page 410
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