Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means "meeting the user's needs at a minimum cost". The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.
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Most Helpful Customer Reviews
5 of 5 people found the following review helpful:
5.0 out of 5 stars
Excellent textbook for VLSI testing.,
By A Customer
This review is from: Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17) (Hardcover)
This book is, as far as I know, the most comprehensive texbook on VLSI testing available at the moment. It is based on current trends and techniques in the field. After all, the authors are pioneers in this area. A worthy successor to Abramovici's earlier textbook, which, I think is beginning to look increasingly archaic. As a guy who's taken a course in testing by the authors (we were the guinea pigs for the book, actually)and is currently working in the VLSI testing area, I strongly recommend it to anyone looking to build strong testing fundamentals.
6 of 9 people found the following review helpful:
2.0 out of 5 stars
Not a good book for ATE,
By Online Amazon Buyer (Newton, Mass) - See all my reviews
Amazon Verified Purchase(What's this?)
This review is from: Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17) (Hardcover)
It seems to me it is just a summary of work done by others inthe ATE field over the years. The explanations of how a device fault is detected are not clear in most of the cases presented in the book. The book emphasizes too much on fault modeling but not enough on test applications and techniques. Certainly not a good text book for students nor it
5.0 out of 5 stars
Very good book,
By RS (Hillsboro, OR) - See all my reviews
Amazon Verified Purchase(What's this?)
This review is from: Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17) (Hardcover)
I loved the clarity of the book. It's very easy to follow. Agreed that it tries to cover a lot of topics and naturally will not go very deep into everything that you want. But definitely a great book to pick up and get all of your fundamentals and more strengthened.
If you find anything wrong in the book, you can email the authors and they would promptly address it in the next version.
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Inside This Book
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First Sentence:
Now that you have picked up this book we want to convince you that it will help you. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
dominance fault collapsing, hardware pattern generator, branch observabilities, serial fault simulator, analog circuit testing, good machine signature, test vector selection, boundary scan hardware, analog fault models, idempotent coupling faults, parallel fault simulator, deductive fault simulation, multiple fault model, mutual comparator, unit test period, analog test bus, chip area overhead, neighborhood pattern sensitive faults, address decoder faults, boundary register cells, concurrent fault simulator, test bus interface circuit, boundary scan data, compute the combinational, parallel fault simulation Key Phrases - Capitalized Phrases (CAPs): (learn more)
Address Stepper, All All All All All, Bell Labs, Digital Input, Steps of Example, Lucent Technologies, Output Data Register, Rederive Equation, Tiling Yes None New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Now that you have picked up this book we want to convince you that it will help you. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
dominance fault collapsing, hardware pattern generator, branch observabilities, serial fault simulator, analog circuit testing, good machine signature, test vector selection, boundary scan hardware, analog fault models, idempotent coupling faults, parallel fault simulator, deductive fault simulation, multiple fault model, mutual comparator, unit test period, analog test bus, chip area overhead, neighborhood pattern sensitive faults, address decoder faults, boundary register cells, concurrent fault simulator, test bus interface circuit, boundary scan data, compute the combinational, parallel fault simulation Key Phrases - Capitalized Phrases (CAPs): (learn more)
Address Stepper, All All All All All, Bell Labs, Digital Input, Steps of Example, Lucent Technologies, Output Data Register, Rederive Equation, Tiling Yes None New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 100
books:
See all 100 books this book cites
- Analog and Mixed-Signal Test by Bapiraju Vinnakota on 4 pages
- A30.5 Integrated Circuits Video by Thomson Delmar Learning on 4 pages
- Multi-Chip Module Test Strategies (Frontiers in Electronic Testing) by Yervant Zorian in Front Matter, Back Matter (1), and Back Matter (2)
- Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques (Frontiers in Electronic Testing) by Wolfgang Kunz in Front Matter, Back Matter (1), and Back Matter (2)
- Testing and Testable Design of High-Density Random-Access Memories (Frontiers in Electronic Testing) by Pinaki Mazumder in Front Matter, Back Matter (1), and Back Matter (2)
See all 100 books this book cites
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