Key Phrases - Statistically Improbable Phrases (SIPs):
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conchoidal marks, electronic failure analysis, macrofractographic features, final overload fracture, torsion overload, extensive fiber pullout, fatigue test sample, resolved normal stress, radial marks, resin lamina, shear dimples, effective crack size, dimple rupture, slant fracture, replicating tape, fracture surface appearance, notch severity, fatigue striations, fracture topography, ratchet marks, fibrous zone, fatigue fracture surface, cathodic cleaning, stereo angle, void coalescence
Key Phrases - Capitalized Phrases (CAPs):
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Metals Handbook, New York, Metals Park, Vander Voort, Electronic Failure Analysis Handbook, Materials Park, John Wiley, Elsevier Science, Cambridge University Press, Fracture Surface Micromorphology, Printed Circuit Board Materials Handbook, Systematic Analysis of Technical Failures, Battelle Columbus Laboratories, Counts Element, Engineering Solids, Englewood Cliffs, Fractography of Modern Engineering Materials, Oxford University Press, Principles of Electronic Packaging, Reilly Inhibitor, Research Institute, The Corrosion Handbook, Van Nostrand Reinhold, Verlag Stahleisen
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