First Sentence:
Figure 1.1 is a schematic representation of electronic package hierarchy.
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Key Phrases - Statistically Improbable Phrases (SIPs):
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chip interconnect systems, conductive adhesive bumps, bond pad pattern, compliant bumps, polymer bumps, neighboring interconnections, bump assemblies, fluxless process, heatsink base, damage integral approach, test fault coverage, conductive adhesive paste, global thermal expansion mismatch, wire bumping, yielded chips, flip chip applications, grease thickness, waffle trays, stud bumps, flip chip solder joints, interconnection resistance, conductive adhesive films, flip chip assembly, area array pitch, bump diameter
Key Phrases - Capitalized Phrases (CAPs):
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New York, Flip-Chip Bonding, Van Nostrand Reinhold, Technology Conference, San Jose, International Conference, Research Devel, Electronic Components Conference, Advanced Packaging Symposium, Seiko Epson, Circuit World, Electrochemical Publications, Solid State Technol, Thin Solid Films, Area of Chip, Epoxy Technology, Flip-Chip System, Introduction Flip, Parameter Polymer, San Diego, Wafer Labor, West Proceedings, Components Hybrid Manufact, International Electronics Packaging Conference, International Symposium
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