This timely handbook contains chapters on the essential elements of high resolution charged particle optics and is written by many of the worlds leading research scientists. It is a complete guide to understanding, designing, and using high resolution instrumentation such as transmission electron microscopes (TEMs), scanning electron microscopes (SEMs), scanning transmission electron microscopes (STEMs), and focused ion beam (FIB) systems. This handbook is evenly balanced between theory and application, and covers all the most important topics in this growing area. Handbook of High Resolution Charged Particle Optics explains how and why high resolution instruments work and how to apply this information when designing or using them.
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4 of 4 people found the following review helpful:
5.0 out of 5 stars
A great overview of the field!,
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This review is from: Handbook of Charged Particle Optics (Hardcover)
For anyone working in accelerator physics, electron microscopy, or microwave tube design, this book provides an excellent and very up to date picture of the field. Each chapter is contributed by an expert in the field. Highly recommend it!
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Inside This Book
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First Sentence:
This chapter summarizes the main techniques currently available for the numerical simulation and computer-aided design of electron and ion optical systems. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
trajectory displacement effect, accelerating voltage inspection, accelerating voltage operation, closest encounter approximation, discrete coulomb interactions, dynamic focus coils, geometric aberration coefficients, polepiece material, computed aberrations, beam projection system, deflection astigmatism, electron source types, asymmetry aberrations, beam regime, charged particle optics, crossover plane, electrostatic microscopes, unipotential lenses, magnetic electron lenses, axial field distributions, electron optical properties, narrow crossover, polepiece lens, emitter radius, best focus position Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Electron Microsc, Academic Press, Methods Phys, Electron Phys, Monte Carlo, University of Chicago, Editions de Physique, Les Ulis, Courtesy of Hughes Research Labs, Field Emission Symp, Oregon Graduate, Research Studies Press, Academia Sinica, Elsevier Science, Guns Figure, Institute of Electronics, Multinational Congress Electron, Plenum Press, Analytical Approach, John Wiley, Microcircuit Engineering, Oxford University, Parameter Dependencies When the Collisions, Philips Res New!
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
This chapter summarizes the main techniques currently available for the numerical simulation and computer-aided design of electron and ion optical systems. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
trajectory displacement effect, accelerating voltage inspection, accelerating voltage operation, closest encounter approximation, discrete coulomb interactions, dynamic focus coils, geometric aberration coefficients, polepiece material, computed aberrations, beam projection system, deflection astigmatism, electron source types, asymmetry aberrations, beam regime, charged particle optics, crossover plane, electrostatic microscopes, unipotential lenses, magnetic electron lenses, axial field distributions, electron optical properties, narrow crossover, polepiece lens, emitter radius, best focus position Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Electron Microsc, Academic Press, Methods Phys, Electron Phys, Monte Carlo, University of Chicago, Editions de Physique, Les Ulis, Courtesy of Hughes Research Labs, Field Emission Symp, Oregon Graduate, Research Studies Press, Academia Sinica, Elsevier Science, Guns Figure, Institute of Electronics, Multinational Congress Electron, Plenum Press, Analytical Approach, John Wiley, Microcircuit Engineering, Oxford University, Parameter Dependencies When the Collisions, Philips Res New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 38
books:
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11
books
cite this book:
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- Magnetic Electron Lenses (Topics in Current Physics) by Peter W. Hawkes on 7 pages
- Principles of Electron Optics, Volume 2: Applied Geometrical Optics by Peter W. Hawkes on 5 pages
- Focused Ion Beams from Liquid Metal Ion Sources (Electronic and Electrical Engineering Research Studies: Microengineering Series) by P. D. Prewett on 4 pages
- Secondary Ion Mass Spectrometry: SIMS VII by A. Benninghoven on page 483, Back Matter (1), and Back Matter (2)
- Progress in Optics, Vol. 27 by Author Unknown on page 425, and Back Matter
See all 38 books this book cites
- Advances in Imaging and Electron Physics, Volume 123: Advances in Electron Microscopy and Diffraction by Peter W. Hawkes on 4 pages
- Scanning Auger Electron Microscopy by Martin Prutton on page 122, and page 161
- Optik, Licht und Laser by Dieter Meschede in Back Matter
- High Resolution Focused Ion Beams: FIB and Applications by Jon Orloff on page 76
- Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003 (Institute of Physics Conference Series) by S McVitie on page 172
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