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The Handbook of Surface and Nanometrology
 
 
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The Handbook of Surface and Nanometrology [Hardcover]

David J. Whitehouse (Author)


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Handbook of Surface and Nanometrology, Second Edition Handbook of Surface and Nanometrology, Second Edition
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Book Description

June 2002 0750305835 978-0750305839 1
The Handbook of Surface and Nanometrology explains and challenges current concepts in nanotechnology. It covers in great detail surface metrology and nanometrology and more importantly the areas where they overlap, thereby providing a quantitative means of controlling and predicting processes and performance. Trends and mechanisms are explained with numerous practical examples.

Bringing engineering and physics together at the nanoscale reveals some astonishing effects: geometric features such as shape change meaning; roughness can disappear altogether; signals from instruments have to be dealt with differently depending on scale. These and other aspects are dealt with for the first time in this book. It is relevant not only for today's technology but also for future advances. Many aspects of nanotechnology and precision engineering are considered in chapters on manufacture, characterization, standardization, performance and instrumentation. There is a special chapter on nanometrology and this subject permeates the whole book.

The Handbook of Surface and Nanometrology is the only book that covers these subject areas and is the definitive work in this field. This book is indispensable for firms making, trading, and researching semiconductor devices, MEMS, and micro-optics, as well as tradition precision engineering products. It will also be useful in quality control as well as for research scientists, development engineers, and production managers.

Editorial Reviews

Review

The Handbook of Surface and Nanometrology contains a wealth of information for both practical and research engineers. For Taylor Hobson, the volume epitomises the nature of the art of surface metrology and instrument engineering, as could only be recorded through a lifetime of dedication to the subject. This book will give both guidance and food for thought for anyone interested in the subject at whatever level.
- Bruce Wilson, Taylor Hobson

The book is very useful to the colleagues of my Institute. It will be one of the best books in our library.
- Professor Yuri Chugui

Product Details

  • Hardcover: 1150 pages
  • Publisher: Taylor & Francis; 1 edition (June 2002)
  • Language: English
  • ISBN-10: 0750305835
  • ISBN-13: 978-0750305839
  • Product Dimensions: 9.8 x 7.5 x 2.5 inches
  • Shipping Weight: 6 pounds
  • Amazon Best Sellers Rank: #5,656,353 in Books (See Top 100 in Books)

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Inside This Book (learn more)
First Sentence:
Before this question can be answered it would be a good idea to define the word metrology. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
roundness instrument, cylindricity measurement, surface metrology, areal case, material ratio curve, material probability curve, metrology loop, radius suppression, asperity persistence, mean peak curvature, stylus beam, fewer ordinates, stylus methods, random process analysis, reciprocating grinding, summit density, indicating surface texture, ductile machining, tetragonal case, roundness measurement, longitudinal roughness, summit curvature, profile ordinate, grinding load, areal properties
Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Rank Organisation, Cambridge University Press, Workpiece Figure, Thesis Leicester University, Twyman Green, Von Turkovich, Acta Metall, Atomic-bit Chemical, Extreme Defects, Fatigue Fluid, Heat Mass Transfer, Jpn Soc, Oxford University Press, San Diego, Type Processing
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