High Resolution Focused Ion Beams: FIB and Applications [Hardcover]

Jon Orloff (Author), Lynwood Swanson (Author), Mark Utlaut (Author)

Book Description

Publication Date: October 31, 2002 | ISBN-10: 030647350X | ISBN-13: 978-0306473500 | Edition: 1

In this book, we have attempted to produce a reference on high resolution focused ion beams (FIBs) that will be useful for both the user and the designer of FIB instrumentation. We have included a mix of theory and applications that seemed most useful to us. The field of FIBs has advanced rapidly since the application of the first field emission ion sources in the early 1970s. The development of the liquid metal ion source (LMIS) in the late 1960s and early 1970s and its application for FIBs in the late 1970s have resulted in a powerful tool for research and for industry. There have been hundreds of papers written on many aspects of LMIS and FIBs, and a useful and informative book on these subjects was published in 1991 by Phil Prewett and Grame Mair. Because there have been so many new applications and uses found for FIBs in the last ten years we felt that it was time for another book on the subject.

Product Details

• Hardcover: 316 pages
• Publisher: Springer; 1 edition (October 31, 2002)
• Language: English
• ISBN-10: 030647350X
• ISBN-13: 978-0306473500
• Product Dimensions: 9.3 x 6.2 x 1 inches
• Shipping Weight: 1.2 pounds (View shipping rates and policies)
• Average Customer Review: 4.0 out of 5 stars  See all reviews (3 customer reviews)
• Amazon Best Sellers Rank: #2,715,617 in Books (See Top 100 in Books)

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Customer Reviews

Most Helpful Customer Reviews

4 of 5 people found the following review helpful:

5.0 out of 5 stars Mark Utlaut is the sexiest man alive, April 18, 2004

By 

Riccardo Levi-Setti (Chicago, IL) - See all my reviews

This review is from: High Resolution Focused Ion Beams: FIB and Applications (Hardcover)

As a researcher working in the field of focused ion beams for almost thirty years, I can honestly say that this is the finest book ever written on the subject. Their treatment of the Fowler-Nordheim equation is particularly noteworthy.

More importantly, their use of rhyme, ala Dr. Seuss, makes for an easy read. Here's a short excerpt from the book's introduction which illustrates my point.

"An ion is so very small
You'll never see one in the hall
You'll never see one at the mall

You'll never see one at your house
You'll never see one with a mouse

These tiny things you'll never see
Are still very useful to you and me
They're also useful to industry."

1 of 1 people found the following review helpful:

2.0 out of 5 stars Not what I did expect, June 6, 2008

By 

Dr. Vratko Vokal "Vratko" (Petten, Netherlands) - See all my reviews
(REAL NAME)   

This review is from: High Resolution Focused Ion Beams: FIB and Applications (Hardcover)

First, I must say that I am reviewing this book from a side of scientist who wanted to learn mostly on applications and on related physics necessary to understand a topic of application itself.

Minuses of the book:
-Book is not thorough on application. One-day review of journal publications would do better. I did expect much more, much much more on application, especially when much more is present at the field.
-Pictures are of the lowest quality I have ever seen in 2k book. It is something one would expect from the book printed in 50ties. Even then they had extra photo sheets if needed. Check the photos on cover - such a quality you will not see in the book. This was very disappointing for me - on some pictures you even miss the point of an image because of the lack of quality. I was seriously thinking of returning a book (I never did that before). Picture low quality is that overwhelming at first touch that any possible value what book can possibly give can be lost.
-half of book is on LMIS and such an approach is not what I was looking for - this is not a mistake of the book itself - it is a mistake of reviews present here and mostly of description of the book here.
- (for me it was deficit as space was lost on what I did not looked for but can be advantage if someone is looking for this approach)lot of math-physics which I do think is for advanced user and especially everyday user of FIB.

Pluses of the book:
-nicely described channeling effect. One who is looking for such a explanation can take this book as a first reference.
- If someone is looking for thorough description about LMIS - this is the book.

In short way - not as introductory book for students. I find one half of book completely out of my interest even thought I do love FIB and I am a thorough user of its applications.

I am in need to buy Lucille A. Giannuzzi and to see what is in there - its also cheaper.

And one way comment about the price - 150+USD for such a print quality is just a steeling - no offense.

0 of 1 people found the following review helpful:

5.0 out of 5 stars Excellent reference of FIB technology, June 13, 2004

By 

Valery Ray (Methuen, MA USA) - See all my reviews

This review is from: High Resolution Focused Ion Beams: FIB and Applications (Hardcover)

Excellent reference with good balance between theoretical discussion and practical data, very thorough bibliography. The best single source of concentrated information for anyone using or building FIB systems.

Section on Applications of Focused Ion Beams could be significantly expanded in future editions, as the industrial applications of the FIB advance rapidly.