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High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science) [Hardcover]

Frank Ernst (Editor), Manfred R�hle (Editor)

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Book Description

ISBN-10: 3540418180 | ISBN-13: 978-3540418184 | Publication Date: January 31, 2003 | Edition: 1st

This book gives a survey of, and systematic introduction to, high-resolution electron microscopy. The method is thoroughly discussed; the latest developments are reported; and applications to surface and interface analysis and to the study of hidden structures are detailed. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

#outer_postBodyPS { display: none; } #psGradient { display: none; } #psPlaceHolder { display: none; } #psExpand { display: none; } This book gives a survey of, and systematic introduction to, high-resolution electron microscopy. The method is thoroughly discussed; the latest developments are reported; and applications to surface and interface analysis and to the study of hidden structures are detailed. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

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Editorial Reviews

From the Back Cover

This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

Product Details

Hardcover: 455 pages
Publisher: Springer; 1st edition (January 31, 2003)
Language: English
ISBN-10: 3540418180
ISBN-13: 978-3540418184
Product Dimensions: 9.2 x 6.3 x 0.6 inches
Shipping Weight: 1.9 pounds (View shipping rates and policies)
Amazon Best Sellers Rank: #4,102,773 in Books (See Top 100 in Books)

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Inside This Book (learn more)

First Sentence:
No material has a perfect structure. Read the first page

Key Phrases - Capitalized Phrases (CAPs): (learn more)
Surf Sci, Phys Rev Lett, New York, Volkswagen Foundation, Appl Phys Lett, Multi-Method High-Resolution Surface Analysis, Phil Mag, Surf Rev Lett, Vac Sci Technol, Academic Press, Acta Cryst, Physikalisches Institut, Plenum Press, Rep Prog Phys, Applied Surface Science, Rev Sci Instrum, Springer Series, Acta Mater, Adaptive Fourier, Cambridge University Press, Europhys Lett, Magn Magn Mater, Nucl Instrum Meth Phys Res, Surface Sciences, Symp Proc

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Citations (learn more)

This book cites 39 books:

Energy-Filtering Transmission Electron Microscopy (Springer Series in Optical Sciences) by Ludwig Reimer on page 66, page 270, and page 389
Scanning Tunneling Microscopy (Perspectives in Condensed Matter Physics) by H. Neddermeyer on page 321, page 356, and page 360
Electron Microdiffraction by J.M. Zuo on page 67, and page 186
Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light by Max Born on page 67, and page 269
Modern Quantum Mechanics (Revised Edition) by J. J. Sakurai on page 66, and page 269

See all 39 books this book cites

2 books cite this book:

Advances in Imaging and Electron Physics, Volume 123: Advances in Electron Microscopy and Diffraction by Peter W. Hawkes on page 30
The Local Chemical Analysis of Materials, Volume 9 (Pergamon Materials Series) by J. W. Martin Emeritus Reader in Physical Metallurgy on page 200

Books on Related Topics (learn more)

Introduction to Conventional Transmission Electron Microscopy by Marc De Graef

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