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High-Resolution Electron Microscopy (Monographs on the Physics and Chemistry of Materials)
 
 

High-Resolution Electron Microscopy (Monographs on the Physics and Chemistry of Materials) [Hardcover]

John C. H. Spence (Author)
5.0 out of 5 stars  See all reviews (1 customer review)

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Book Description

April 3, 2003 0198509154 978-0198509158 3
The discovery of the Nanotube in 1991 by electron microscopy ha ushered in the era of Nanoscience. The atomic-resolution electron microscope has been a crucial tool in this effort. This book gives the basic theoretical background needed to understand how electron microscopes allow us to see atoms, togeher with highly practical advice for electron microscope operators. The book covers the usefulness of seeing atoms in the semiconductor industry, in materials science and condensed matter physics. Biologists have recently used the atomic-resolution electron microscope to obtain three-dimensional images of the Ribosome, work wihich is covered in this book. The book also shows how the ability to see atomic arrangements has helped us understand the properties of matter. This new third edition of the standard text retains the early sections on the fundamentals of electron optics, linear imaging theory with partial coherence and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of the arrangement of atoms in thin crystals using a modern electron microscope. Sources of software for image interpretation and electron-optical design are also given.

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Customers buy this book with Transmission Electron Microscopy: Physics of Image Formation (Springer Series in Optical Sciences) $126.44

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Editorial Reviews

Review

`Review from previous edition 'this is a tremendously useful compilation...Spence...has recapitulated a certain amount of more elementary material which, coupled with the easy -- almost conversational -- style, make the book extremely accessible' **For second edition' P.W. Hawkes, Ultramicroscopy

About the Author

Prof. John C.H. Spence Physics, Arizona State University, Tempe, Az 85287-1504. USA USA-480-965-6486 USA-480-965-7954 spence@asu.edu American Citizen. Born: Canberra Australia. April 4, 1946.

Product Details

  • Hardcover: 428 pages
  • Publisher: Oxford University Press, USA; 3 edition (April 3, 2003)
  • Language: English
  • ISBN-10: 0198509154
  • ISBN-13: 978-0198509158
  • Product Dimensions: 9.4 x 6.2 x 1.3 inches
  • Shipping Weight: 1.8 pounds (View shipping rates and policies)
  • Average Customer Review: 5.0 out of 5 stars  See all reviews (1 customer review)
  • Amazon Best Sellers Rank: #2,716,669 in Books (See Top 100 in Books)

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5.0 out of 5 stars A classic take on high-resolution transmission electron microscopy, September 27, 2010
By 
Ulfilas (Washington, DC) - See all my reviews
I bought the original 1980 addition 25 five years ago as a post-doc looking to get into high-resolution transmission electron microscopy (HRTEM). This book gave me what I needed to get started and publishing in what was then a fairly new field. Now imaging atomic lattices is fairly commonplace and HRTEM has gone well beyond the what was state-of-the-art in 1980. Nevertheless, if any topic is ever explained clearly even once, nobody will every bother again, so this is still a useful book in many ways. I found the introduction to phase contrast microscopy at the beginning of the book especially valuable--particularly in its use of actual electron micrographs to illustrate the appearance of a bright fringe at the edge of an object for the under focus condition, with a dark finge visible in the over focus condition. When read along with Cowley's book Diffraction Physics the reader has a pretty good picture of the still very useful conventional HRTEM technique.
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Inside This Book (learn more)
First Sentence:
The conventional transmission electron microscope bears a close resemblance to an optical microscope in which image contrast (intensity variation) is produced by the variation in optical absorption from point to point on the specimen. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
diffractogram analysis, incoherent instabilities, partial coherence effects, central beam stop, focused illumination spot, illuminating aperture, projector focal length, source energy spread, charge density approximation, viewing phosphor, elastic wavefield, damping envelope, thinnest specimens, coherence width, gun bias, multislice method, increasing defocus, objective aperture size, tilted illumination, fresnel fringes, electronic instabilities, lens excitation, gaussian focus, electron microdiffraction, magnification calibration
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Academic Press, Van Dyck, Electron Microsc, Acta Crystallogr, Oxford University Press, Acta Crvstallogr, Institute of Physics, San Francisco Press, Arizona State University, Baton Rouge, Cambridge University Press, Mater Sci, Plenum Press, References Agar, Research Institute, The Bethe, Van Nostrand Reinhold, Van Tenderloo
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