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High-Resolution Electron Microscopy (Monographs on the Physics and Chemistry of Materials) 3rd Edition

5 out of 5 stars 1 customer review
ISBN-13: 978-0199552757
ISBN-10: 0199552754
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Editorial Reviews

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"The paperback edition is recommended for students and beginning researchers in TEM..." --Microscopy and Microanalysis


About the Author


John Spence is a Fellow of the American Physical Society and of the Institute of physics, a recent co-editor of Acta Crystallographica and serves on the editorial board of Reports on Progress in Physics. He also serves on the Scientific Advisory Committee of the Molecular Foundary and the Advanced Light Source at the Lawrence Berkeley Laboratory. He is a member of the International Union of Crystallography's Commission on Electron Diffraction, and winner of the Burton award of the Microscopy Society of America.
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Product Details

  • Series: Monographs on the Physics and Chemistry of Materials (Book 60)
  • Paperback: 424 pages
  • Publisher: Oxford University Press; 3 edition (February 15, 2009)
  • Language: English
  • ISBN-10: 0199552754
  • ISBN-13: 978-0199552757
  • Product Dimensions: 9.1 x 1 x 6.1 inches
  • Shipping Weight: 1.5 pounds (View shipping rates and policies)
  • Average Customer Review: 5.0 out of 5 stars  See all reviews (1 customer review)
  • Amazon Best Sellers Rank: #2,181,998 in Books (See Top 100 in Books)

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Format: Paperback
I bought the original 1980 addition 25 five years ago as a post-doc looking to get into high-resolution transmission electron microscopy (HRTEM). This book gave me what I needed to get started and publishing in what was then a fairly new field. Now imaging atomic lattices is fairly commonplace and HRTEM has gone well beyond the what was state-of-the-art in 1980. Nevertheless, if any topic is ever explained clearly even once, nobody will every bother again, so this is still a useful book in many ways. I found the introduction to phase contrast microscopy at the beginning of the book especially valuable--particularly in its use of actual electron micrographs to illustrate the appearance of a bright fringe at the edge of an object for the under focus condition, with a dark finge visible in the over focus condition. When read along with Cowley's book Diffraction Physics the reader has a pretty good picture of the still very useful conventional HRTEM technique.
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High-Resolution Electron Microscopy (Monographs on the Physics and Chemistry of Materials)
This item: High-Resolution Electron Microscopy (Monographs on the Physics and Chemistry of Materials)
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