The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.
High Resolution X-Ray Diffractometry and Topography
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A review,
By www.raioxconsultoria.com (Campinas, SP Brazil) - See all my reviews
This review is from: High Resolution X-Ray Diffractometry And Topography (Hardcover)
This is a new generation book. Most books available in the field cover the whole history of the X-ray scattering theories and applications. Then, specific applications that are very important in our days for industries and scientific researches are not properly treated. This book does begin where other related books have finished. The issues covered are not found anywhere else together, in a same volume, as they are here. It is fundamental to the new era of materials characterization.
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Inside This Book
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First Sentence:
We first define the geometry and instrumental parameters common to high resolution diffractometry. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
beam conditioner, white radiation topography, high resolution diffractometry, new wavefields, simulated rocking curves, section topograph, monochromating crystal, high strain sensitivity, rocking curve width, dynamical images, dispersion surface, dispersion plane, asymmetric reflection, reciprocal space map, substrate peak, analyser crystal, kinematical theory, thickness fringes, extinction distance, specimen crystal, specimen angle, dislocation images, intermediary image, diffuse scatter, beam vector Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Acta Cryst, X-ray Analysis, Durham University, Plenum Press, Bede Scientific, Double-crystal X-ray, Experiment Simulation, Photon Factory, Simulation Experiment New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Surprise Me!
We first define the geometry and instrumental parameters common to high resolution diffractometry. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
beam conditioner, white radiation topography, high resolution diffractometry, new wavefields, simulated rocking curves, section topograph, monochromating crystal, high strain sensitivity, rocking curve width, dynamical images, dispersion surface, dispersion plane, asymmetric reflection, reciprocal space map, substrate peak, analyser crystal, kinematical theory, thickness fringes, extinction distance, specimen crystal, specimen angle, dislocation images, intermediary image, diffuse scatter, beam vector Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Acta Cryst, X-ray Analysis, Durham University, Plenum Press, Bede Scientific, Double-crystal X-ray, Experiment Simulation, Photon Factory, Simulation Experiment New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Surprise Me!
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