The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots. Both the theoretical background and the application of the methods are discussed. The second edition is extended to deal with lateral surface nanostructures such as gratings and dots, new examples for measuring layer thickness, lattice mismatch, and surface/interface roughness. The book will be an invaluable source for graduates and scientists.
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Key Phrases - Statistically Improbable Phrases (SIPs):
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grating rods, grating truncation rods, resonant diffuse scattering, homogeneous wavefield, vertical lattice misfit, conventional coplanar diffraction, lateral superstructure, purely dynamical nature, satellite maxima, lateral maxima, buried gratings, crystal truncation rod, coherent reflectivity, ill reciprocal space, energy band pass, strain gratings, diffusely scattered intensity, reciprocal space distribution, averaged lattice, transversal scan, intrinsic roughness, grating peaks, beam compressor, grating shape, diffraction curves Key Phrases - Capitalized Phrases (CAPs): (learn more)
Periodic Nanostructures, Determination of the Lateral Superstructure, Self-Organized Structures, Diffuse Scattering From Volume Defects, Strain Analvsis, Strain Evolution Due New!
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grating rods, grating truncation rods, resonant diffuse scattering, homogeneous wavefield, vertical lattice misfit, conventional coplanar diffraction, lateral superstructure, purely dynamical nature, satellite maxima, lateral maxima, buried gratings, crystal truncation rod, coherent reflectivity, ill reciprocal space, energy band pass, strain gratings, diffusely scattered intensity, reciprocal space distribution, averaged lattice, transversal scan, intrinsic roughness, grating peaks, beam compressor, grating shape, diffraction curves Key Phrases - Capitalized Phrases (CAPs): (learn more)
Periodic Nanostructures, Determination of the Lateral Superstructure, Self-Organized Structures, Diffuse Scattering From Volume Defects, Strain Analvsis, Strain Evolution Due New!
Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 8
books:
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- X-ray Diffraction (Pure & Applied Physics) by Leonid V. Azaroff in Back Matter
- Introduction to the Quantum Theory of Scattering (Pure and Applied Physics, Vol 26) by L. S. Rodberg in Back Matter
- Quantum Mechanics by A.S. Davydov in Back Matter
- X-Ray Scattering from Semiconductors by Paul F. Fewster in Back Matter
- X-Ray Diffraction (Dover Books on Physics) by B. E. Warren in Back Matter
See all 8 books this book cites
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