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Hot-Carrier Reliability of MOS VLSI Circuits (The Springer International Series in Engineering and Computer Science) 1993rd Edition

ISBN-13: 978-0792393528
ISBN-10: 079239352X
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About the Author

Yusuf Leblebici is Director and Chair Professor of the Microelectronic Systems Laboratory at the Swiss Federal Institute of Technology in Lausanne (EPFL). He has previously worked as a faculty member at University of Illinois at Urbana-Champaign, at Istanbul Technical University, and at Worcester Polytechnic Institute (WPI), where he established and directed the VLSI Design Laboratory, and also served as a project director at the New England Center for Analog and Mixed-Signal IC Design. He is a co-author of more than 150 scientific articles and 3 textbooks.
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Hot-Carrier Reliability of MOS VLSI Circuits (The Springer International Series in Engineering and Computer Science)
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