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1 of 1 people found the following review helpful:
3.0 out of 5 stars
Quickly Written - No Meat,
By A Customer
This review is from: Iddq Testing for CMOS VLSI (Hardcover)
This book discusses a few issues involved in IDDQ testing, theauthors research in bridging faults and some research done by Hawkins and Soden.Very little detail is given about On-Chip Current Sensors or the QTAG standard. Other topics like estimating Quiescent Current and fault modeling are only discussed briefly. This book was written as an attempt to get a book out quickly on a "hot" topic. Someone should write an in-depth book discussing all of the pressing IDDQ issues in detail without this "get to market" time constraint. The book however can introduce a novice reader to IDDQ but it is not for an intermediate or advanced engineer. If it was the intent of the author to write a book for novices he should have discussed more basic VLSI Design.
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Iddq Testing for CMOS VLSI by Rochit Rajsuman (Hardcover - Oct. 1994)
$50.00
In Stock | |
 
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