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Image Analysis: Applications in Materials Engineering (Materials Science & Technology)
 
 
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Image Analysis: Applications in Materials Engineering (Materials Science & Technology) [Hardcover]

Leszek Wojnar (Author)
4.0 out of 5 stars  See all reviews (1 customer review)

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Book Description

0849382262 978-0849382260 October 28, 1998 1
Minimizing theoretical background and mathematical formalism, Image Analysis provides basic principles of image acquisition, enhancement, measurements, and interpretation in a very simple form, using an approach toward applications and properties of available tools. The singular study lists different tasks to do and offers complete solutions to these tasks, based on the author's experience with the procedures described.

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Product Details

  • Hardcover: 256 pages
  • Publisher: CRC Press; 1 edition (October 28, 1998)
  • Language: English
  • ISBN-10: 0849382262
  • ISBN-13: 978-0849382260
  • Product Dimensions: 9.2 x 6.3 x 0.8 inches
  • Shipping Weight: 1.2 pounds (View shipping rates and policies)
  • Average Customer Review: 4.0 out of 5 stars  See all reviews (1 customer review)
  • Amazon Best Sellers Rank: #3,790,477 in Books (See Top 100 in Books)

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1 of 1 people found the following review helpful:
4.0 out of 5 stars Valuable Text / First Reference to Image Analysis, June 18, 2000
By 
Ira Haron (Fairfax, Virginia) - See all my reviews
This review is from: Image Analysis: Applications in Materials Engineering (Materials Science & Technology) (Hardcover)
I work for a major IA manufacturer and I was looking for a good introductory to intermediate IA text / reference book to recommend to our new IA users. As I browsed through the major sections, I found that the presentation was clear and concise, was packed with relevant and interesting images and there was insight in the examples. No section appeared intimidating and I seemed to absorb its information readily. I believe the selection of topics was more than adequate for a newbie and I hope the author increases the amount of subject matter and depth in "version 2" because I have a lot more IA to learn. I recommend it highly.
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Inside This Book (learn more)
First Sentence:
During the last ten years we observed a tremendous expansion of more and more powerful personal computers and development of user-friendly, graphically oriented operating systems. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
lost boundary lines, shade correction, detected grain boundaries, eutectic network, internal carbides, simple binarization, gamma modulation, faulty regions, graphite precipitates, linear closing, quantitative fractography, detected grains, eroded set, guard frame, ductile fracture surfaces, ultimate erosion, final detection, image analysis tools, image analysis packages, graphite nodules, initial image, hysteresis threshold, fractographic analysis, materials microstructure, different gray levels
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