The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.
Infrared Ellipsometry on Semiconductor Layer Structures
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Inside This Book
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First Sentence:
Semiconductor device structures consist of stacked layer systems with layers of different alloy compositions, individual dopant incorporation, free-charge-carrier properties, and possibly with hundreds of interfaces. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
surface guided waves, phonon mode frequencies, ellipsometry data, broadening values, model dielectric functions, matrix presentation, lineshape analysis, free charge carriers, epitaxial relationship, mobility parameters, broadening parameters, lattice modes, phonon modes, mobility values, polarization parallel Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Related Alloys, Academic Press, Pulsed Laser Deposition, Materials Research Society, Thin Solid Filins, Thin Solid Films, William Andrew Publishing, Wurtzite-Structure Materials New!
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Semiconductor device structures consist of stacked layer systems with layers of different alloy compositions, individual dopant incorporation, free-charge-carrier properties, and possibly with hundreds of interfaces. Read the first page Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
surface guided waves, phonon mode frequencies, ellipsometry data, broadening values, model dielectric functions, matrix presentation, lineshape analysis, free charge carriers, epitaxial relationship, mobility parameters, broadening parameters, lattice modes, phonon modes, mobility values, polarization parallel Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, Related Alloys, Academic Press, Pulsed Laser Deposition, Materials Research Society, Thin Solid Filins, Thin Solid Films, William Andrew Publishing, Wurtzite-Structure Materials New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 21
books:
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- Physics of Semiconductor Devices by Simon M. Sze on page 74
- Heavy Quark Effective Theory (Springer Tracts in Modern Physics) by Andrey G. Grozin in Back Matter
- Effective Field Theories in Flavour Physics (Springer Tracts in Modern Physics) by Thomas Mannel in Back Matter
- Coverings of Discrete Quasiperiodic Sets (Springer Tracts in Modern Physics) by Peter Kramer in Back Matter
- Applied Asymptotic Expansions in Momenta and Masses (Springer Tracts in Modern Physics) by Vladimir A. Smirnov in Back Matter
See all 21 books this book cites
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