Integrated product testing and evaluation;: A systems approach to improve reliability and quality [Hardcover]

Harold L Gilmore (Author)

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Product Details

Hardcover: 351 pages
Publisher: Wiley-Interscience (1969)
Language: English
ISBN-10: 0471766208
ISBN-13: 978-0471766209
Amazon Best Sellers Rank: #11,081,874 in Books (See Top 100 in Books)

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Inside This Book (learn more)
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First Sentence:
The explosive advance of industrial, military, and aerospace technologies has given rise to an entirely new scientific function-that of test and evaluation engineering. Read the first page

Key Phrases - Capitalized Phrases (CAPs): (learn more)
New York, The Automated Systems Design Team, Operations Center, American Management Assoc, John Wiley, Library of Congress, Test Review Board, Defense Technical Information Center, Department of Defense, United States, General Electric, Government Printing Office, Government-Industry Data Exchange Program, National Technical Information Service, Software Test Specification, Test Specification Check List Certain, Albuquerque Operations Office, Atomic Energy Commission, Forward Look, Quality Progress, Software Discrepancy Reports, Standardization Program Handbook, Superintendent of Documents

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Citations (learn more)

This book cites 34 books:

Harris' Shock and Vibration Handbook by Cyril Harris on page 153, and page 185
Handbook of Acoustical Measurements and Noise Control by Cyril M. Harris on page 185
Statistical Quality Control (McGraw-Hill Series in Industrial Engineering and Management) by Eugene Grant on page 231
Statistics in Research by Bernard Ostle on page 231
Quality Circles: Selected Readings (Quality and Reliability Series) by Roger W. Berger in Front Matter

See all 34 books this book cites

3 books cite this book:

Applying Tqm to Product Design and Development (Quality and Reliability) by Marvin Moss on page 269
Applications of Quality Control to the Service Industry (Quality and Reliability) by A. C. Rosander in Front Matter
Designing for Minimal Maintenance Expense (Quality and Reliability) by Marvin A. Moss on page 34

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