Intense Ion and Electron Beams treats intense charged-particle beams used in vacuum tubes, particle beam technology and experimental installations such as free electron lasers and accelerators. It addresses, among other things, the physics and basic theory of intense charged-particle beams; computation and design of charged-particle guns and focusing systems; multiple-beam charged-particle systems; and experimental methods for investigating intense particle beams. The coverage is carefully balanced between the physics of intense charged-particle beams and the design of optical systems for their formation and focusing. It can be recommended to all scientists studying or applying vacuum electronics and charged-particle beam technology, including students, engineers, and researchers.
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Intense Ion and Electron Beams treats intense charged-particle beams used in vacuum tubes, particle beam technology and experimental installations such as free electron lasers and accelerators. It addresses, among other things, the physics and basic theory of intense charged-particle beams; computation and design of charged-particle guns and focusing systems; multiple-beam charged-particle systems; and experimental methods for investigating intense particle beams. The coverage is carefully balanced between the physics of intense charged-particle beams and the design of optical systems for their formation and focusing. It can be recommended to all scientists studying or applying vacuum electronics and charged-particle beam technology, including students, engineers and researchers.
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Inside This Book
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Key Phrases - Statistically Improbable Phrases (SIPs):
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charge particle beam, beam pulsation, charge particle flow, magnetic focusing force, paraxial trajectory equation, beans motion, initial beam radius, beans radius, beam perveance, extracting electrode, semiconductor target, laminar beam, triode gun, diode gun, axially symmetric beam, uniform field region, moving collector, diaphragm lenses, boundary trajectory, defocusing action, strip beam, vector magnetic potential, gun electrodes, paraxial equation, explosive emission Key Phrases - Capitalized Phrases (CAPs): (learn more)
Beam-Current Control, Optical Systems of Technological Installations, Peculiarities of Multiple Systems, Channels Free, Motion of Charge-Beams, Simplified Models of Charged-Particle Beams New!
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
charge particle beam, beam pulsation, charge particle flow, magnetic focusing force, paraxial trajectory equation, beans motion, initial beam radius, beans radius, beam perveance, extracting electrode, semiconductor target, laminar beam, triode gun, diode gun, axially symmetric beam, uniform field region, moving collector, diaphragm lenses, boundary trajectory, defocusing action, strip beam, vector magnetic potential, gun electrodes, paraxial equation, explosive emission Key Phrases - Capitalized Phrases (CAPs): (learn more)
Beam-Current Control, Optical Systems of Technological Installations, Peculiarities of Multiple Systems, Channels Free, Motion of Charge-Beams, Simplified Models of Charged-Particle Beams New!
Books on Related Topics | Concordance | Text Stats Browse Sample Pages:
Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
Citations (learn more)
This book cites 8
books:
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- Static & Dynamic Electricity, 3rd Edition by William R. Smythe in Back Matter
- Charged Particle Beams by Stanley Humphries in Back Matter
- Electron and Ion Optics (Microdevices) by Miklos Szilagyi in Back Matter
- Phase-space Dynamics of Particles (Wiley series in plasma physics) by Allan J. Lichtenberg in Back Matter
- The Variational Principles of Mechanics (Dover Books on Physics) by Cornelius Lanczos in Back Matter
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