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Copper Interconnect Technology (SPIE Tutorial Texts in Optical Engineering Vol. TT46)
 
 
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Copper Interconnect Technology (SPIE Tutorial Texts in Optical Engineering Vol. TT46) [Paperback]

Christoph Steinbruchel (Author), Barry Chin (Author)

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Book Description

0819438979 978-0819438973 January 30, 2001
Copper interconnect technology is expected to be a key component in the quest to create more powerful CPUs and memory chips. This text examines the role of copper in future interconnects, presents the range of problems involved, and explains how the solutions are being found.

Contents

- Introduction
- Interconnect issues
- Copper deposition
- Copper patterning
- Interlayer dielectrics
- Cu/ILD barriers
- Current practice
- Index


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Inside This Book (learn more)
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
damascene approach, wafer bias, undoped oxide, nanoporous silica, magnetron sputter deposition, instantaneous nucleation, interlayer dielectrics, etch products, seed layer, etching plasma, interconnect structures, metal lines, etch rate, copper deposition
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Black Diamond, Applied Materials, Dow Chemical
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Front Cover | Table of Contents | First Pages | Index | Back Cover | Surprise Me!
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