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Interferogram Analysis for Optical Testing (Optical Engineering)
 
 
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Interferogram Analysis for Optical Testing (Optical Engineering) [Hardcover]

Daniel Malacara (Author)


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Hardcover, June 1, 1998 --  
There is a newer edition of this item:
Interferogram Analysis For Optical Testing, Second Edition (Optical Science and Engineering) Interferogram Analysis For Optical Testing, Second Edition (Optical Science and Engineering)
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Book Description

0824799402 978-0824799403 June 1, 1998
"Lays out the fundamentals of, as well as computational methods for, studying fringe patterns produced by optical testing interferometers--providing beginners with the necessary background to enter this field and helping seasoned researchers to refine current analytical approaches. Discusses classical and state-of-the-art fringe analysis techniques with exceptional clarity."

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Editorial Reviews

Review

. . .this book provides a well-constructed overview of an important subject.
---Optics and Lasers in Engineering
. . .[provides] many details as well as practical hints. . . . carefully written and nicely illustrated. . . . No library should miss this book.
---Optik --This text refers to an alternate Hardcover edition.

Product Details

  • Hardcover: 454 pages
  • Publisher: CRC Press (June 1, 1998)
  • Language: English
  • ISBN-10: 0824799402
  • ISBN-13: 978-0824799403
  • Product Dimensions: 9.1 x 6.3 x 1 inches
  • Shipping Weight: 1.5 pounds
  • Amazon Best Sellers Rank: #7,106,888 in Books (See Top 100 in Books)

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Inside This Book (learn more)
First Sentence:
Two-wave interferometers produce an interferogram by superimposing two wavefronts, one of which is typically a flat reference wavefront and the other a distorted wavefront whose shape is to be measured. Read the first page
Key Phrases - Statistically Improbable Phrases (SIPs): (learn more)
detuning sensitivity, circular carrier, estimated wavefront, interferogram irradiance, uniformly spaced sampling points, phase detection algorithms, linear ruling, wavefront under test, detuning error, shifted algorithm, least squares integration, wavefront deformations, linear carrier, aspheric wavefront, automatic fringe analysis, testing wavefront, irradiance transport equation, fringe pattern analysis, zero phase point, phase shifting interferometry, closed fringes, reference interferogram, reference wavefront, peak phase error, tilt fringes
Key Phrases - Capitalized Phrases (CAPs): (learn more)
Fringe Pattern Analysis, New York, John Wiley, Phase-Shifting Interferometry, Phase Measuring Interferometry, Academic Press, Amplitudes of Fourier, Englewood Cliffs, Institute of Physics Publ, Modified Sinusoid Fitting Technique, Phase Shifter Calibration, West Consohocken
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